Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films

Favaloro, T.; Bahk, J. -H.; Shakouri, A.

doi:10.1063/1.4907354

Title: Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films

Journal Article · Fri Feb 13 00:00:00 EST 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4907354· OSTI ID:1369748

Favaloro, T. ^[1]; Bahk, J. -H. ^[2]; Shakouri, A. ^[1]

Univ. of California, Santa Cruz, CA (United States); Purdue Univ., West Lafayette, IN (United States)
Purdue Univ., West Lafayette, IN (United States)

In this work, we describe a novel approach for calibration of the thermoreflectance coefficient, ideally suited for measurements in a vacuum thermostat, and present the high temperature thermoreflectance coefficients for several metals commonly encountered in electronic devices: gold, platinum, and aluminum. The effect of passivation on these metals is also explored, and we demonstrate the signal to noise ratio of a thermoreflectance measurement can be improved with informed selection of the dielectric layer thickness. Additionally, the thermo-optic coefficients of the metals are extracted over a wide temperature range. The results presented here can be utilized in the optimization of experimental configurations for high temperature thermoreflectance imaging.

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Research Organization:: Univ. of California, Santa Barbara, CA (United States). Energy Frontier Research Center (EFRC) Center for Energy Efficient Materials (CEEM)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Army Research Office (ARO)

Grant/Contract Number:: SC0001009

OSTI ID:: 1369748

Alternate ID(s):: OSTI ID: 1228545

Journal Information:: Review of Scientific Instruments, Vol. 86, Issue 2; Related Information: CEEM partners with the University of California, Santa Barbara (lead); Purdue University; Los Alamos National Laboratory; National Renewable Energy Laboratory; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 60 works

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A steady-state thermoreflectance method to measure thermal conductivity Braun, Jeffrey L.; Olson, David H.; Gaskins, John T. Review of Scientific Instruments, Vol. 90, Issue 2 https://doi.org/10.1063/1.5056182	journal	February 2019
Hot carrier dynamics in a dispersionless plasmonic system Nayak, Banoj Kumar; Prabhu, S. S.; Achanta, Venu Gopal Journal of Applied Physics, Vol. 126, Issue 21 https://doi.org/10.1063/1.5119943	journal	December 2019
Unraveling Phononic, Optoacoustic, and Mechanical Properties of Metals with Light-Driven Hypersound Zhang, Hao; Antoncecchi, Alessandro; Edward, Stephen Physical Review Applied, Vol. 13, Issue 1 https://doi.org/10.1103/physrevapplied.13.014010	journal	January 2020
Magneto-Optical Detection of the Spin Hall Effect in Pt and W Thin Films Stamm, C.; Murer, C.; Berritta, M. Physical Review Letters, Vol. 119, Issue 8 https://doi.org/10.1103/physrevlett.119.087203	journal	August 2017
Magneto-Optical Detection of the Spin Hall Effect in Pt and W Thin Films Stamm, Christian; Murer, Christoph; Berritta, Marco arXiv https://doi.org/10.48550/arxiv.1704.06714	text	January 2017
Hot carrier dynamics in a dispersionless plasmonic system Nayak, Banoj Kumar; Prabhu, S. S.; Achanta, Venu Gopal arXiv https://doi.org/10.48550/arxiv.1905.01050	text	January 2019
Simultaneous imaging of magnetic field and temperature distributions by magneto optical indicator microscopy Lee, Hanju; Jeon, Sunghoon; Friedman, Barry Scientific Reports, Vol. 7, Issue 1 https://doi.org/10.1038/srep43804	journal	March 2017
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A numerical fitting routine for frequency-domain thermoreflectance measurements of nanoscale material systems having arbitrary geometries Warzoha, Ronald J.; Wilson, Adam A.; Donovan, Brian F. Journal of Applied Physics, Vol. 129, Issue 3 https://doi.org/10.1063/5.0030168	journal	January 2021

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