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Title: One-dimensional stitching interferometry assisted by a triple-beam interferometer

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/OE.25.009393· OSTI ID:1354698
 [1];  [2];  [3];  [2];  [2]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II); Sichuan Univ., Chengdu (China). School of Aeronautics and Astronautics
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II); Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Applied Physics; Univ. of Chinese Academy of Sciences, Beijing (China)

In this work, we proposed for stitching interferometry to use a triple-beam interferometer to measure both the distance and the tilt for all sub-apertures before the stitching process. The relative piston between two neighboring sub-apertures is then calculated by using the data in the overlapping area. Comparisons are made between our method, and the classical least-squares principle stitching method. Our method can improve the accuracy and repeatability of the classical stitching method when a large number of sub-aperture topographies are taken into account. Our simulations and experiments on flat and spherical mirrors indicate that our proposed method can decrease the influence of the interferometer error from the stitched result. The comparison of stitching system with Fizeau interferometry data is about 2 nm root mean squares and the repeatability is within ± 2.5 nm peak to valley.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Chinese Academy of Sciences (CAS), Shanghai (China)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Chinese Scholarship Council; China Central Universities (China)
Contributing Organization:
Sichuan Univ., Chengdu (China); Univ. of Chinese Academy of Sciences, Beijing (China)
Grant/Contract Number:
AC02-98CH10886; SCU2015D014
OSTI ID:
1354698
Report Number(s):
BNL-113801-2017-JA
Journal Information:
Optics Express, Vol. 25, Issue 8; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 21 works
Citation information provided by
Web of Science

References (17)

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  • Deng, Wantao; Wang, Kaiwei; Zhang, Jinchun
  • 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), SPIE Proceedings https://doi.org/10.1117/12.966324
conference October 2012
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Cited By (7)

Near-null interferometry using an aspheric null lens generating a broad range of variable spherical aberration for flexible test of aspheres journal January 2018
A Non-Contact Measuring System for In-Situ Surface Characterization Based on Laser Confocal Microscopy journal August 2018
Stitching test of large flats by using two orthogonally arranged wavefront interferometers journal January 2017
Completeness condition for unambiguous profile reconstruction by sub-aperture stitching journal January 2018
One-dimensional angular-measurement-based stitching interferometry journal January 2018
Two-dimensional stitching interferometry based on tilt measurement journal January 2018
Absolute profile test by multi-sensor scanning system with relative angle measurement journal October 2018

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