X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications

Boesenberg, Ulrike; Samoylova, Liubov; Roth, Thomas; Zhu, Diling; Terentyev, Sergey; Vannoni, Maurizio; Feng, Yiping; van Driel, Tim Brandt; Song, Sanghoon; Blank, Vladimir; Sinn, Harald; Robert, Aymeric; Madsen, Anders

doi:10.1364/OE.25.002852

Title: X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications

Journal Article · Fri Feb 03 00:00:00 EST 2017 · Optics Express

DOI:https://doi.org/10.1364/OE.25.002852· OSTI ID:1353169

Boesenberg, Ulrike ^[1]; Samoylova, Liubov ^[1]; Roth, Thomas ^[1]; Zhu, Diling ^[2]; Terentyev, Sergey ^[3]; Vannoni, Maurizio ^[1]; Feng, Yiping ^[2]; van Driel, Tim Brandt ^[2]; Song, Sanghoon ^[2]; Blank, Vladimir ^[3]; Sinn, Harald ^[1]; Robert, Aymeric ^[2]; Madsen, Anders ^[1]

European X-Ray Free- Electron Laser Facility, Schenefeld (Germany)
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Technological Institute for Superhard and Novel Carbon Materials, Moscow (Russia)

A precise spectral characterization of every single pulse is required in many x-ray free-electron laser (XFEL) experiments due to the fluctuating spectral content of self-amplified spontaneous emission (SASE) beams. Bent single-crystal spectrometers can provide sufficient spectral resolution to resolve the SASE spikes while also covering the full SASE bandwidth. To better withstand the high heat load induced by the 4.5 MHz repetition rate of pulses at the forthcoming European XFEL facility, a spectrometer based on single-crystal diamond has been developed. Here, we report a direct comparison of the diamond spectrometer with its Si counterpart in experiments performed at the Linac Coherent Light Source.

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Research Organization:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1353169

Journal Information:: Optics Express, Vol. 25, Issue 3; ISSN 1094-4087

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 15 works

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References (16)

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Cited By (3)

Diffraction properties of a strongly bent diamond crystal used as a dispersive spectrometer for XFEL pulses Samoylova, Liubov; Boesenberg, Ulrike; Chumakov, Aleksandr Journal of Synchrotron Radiation, Vol. 26, Issue 4 https://doi.org/10.1107/s1600577519004880	journal	June 2019
Scientific instrument Femtosecond X-ray Experiments (FXE): instrumentation and baseline experimental capabilities Galler, Andreas; Gawelda, Wojciech; Biednov, Mykola Journal of Synchrotron Radiation, Vol. 26, Issue 5 https://doi.org/10.1107/s1600577519006647	journal	August 2019
Photon Beam Transport and Scientific Instruments at the European XFEL Tschentscher, Thomas; Bressler, Christian; Grünert, Jan Applied Sciences, Vol. 7, Issue 6 https://doi.org/10.3390/app7060592	journal	June 2017

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