High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation

Makita, M.; Karvinen, P.; Zhu, D.; Juranic, P. N.; Grünert, J.; Cartier, S.; Jungmann-Smith, J. H.; Lemke, H. T.; Mozzanica, A.; Nelson, S.; Patthey, L.; Sikorski, M.; Song, S.; Feng, Y.; David, C.

doi:10.1364/OPTICA.2.000912

High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation

Journal Article · Fri Oct 16 00:00:00 EDT 2015 · Optica

DOI:https://doi.org/10.1364/OPTICA.2.000912· OSTI ID:1228043

Makita, M. ^[1]; Karvinen, P. ^[1]; Zhu, D. ^[2]; Juranic, P. N. ^[1]; Grünert, J. ^[3]; Cartier, S. ^[1]; Jungmann-Smith, J. H. ^[1]; Lemke, H. T. ^[2]; Mozzanica, A. ^[1]; Nelson, S. ^[2]; Patthey, L. ^[1]; Sikorski, M. ^[2]; Song, S. ^[2]; Feng, Y. ^[2]; David, C. ^[1]

Paul Scherrer Inst. (PSI), Villigen (Switzerland)
SLAC National Accelerator Lab., Menlo Park, CA (United States)
European XFEL GmbH, Hamburg (Germany)

We have developed an on-line spectrometer for hard x-ray free-electron laser (XFEL) radiation based on a nanostructured diamond diffraction grating and a bent crystal analyzer. Our method provides high spectral resolution, interferes negligibly with the XFEL beam, and can withstand the intense hard x-ray pulses at high repetition rates of >100 Hz. The spectrometer is capable of providing shot-to-shot spectral information for the normalization of data obtained in scientific experiments and optimization of the accelerator operation parameters. We have demonstrated these capabilities of the setup at the Linac Coherent Light Source, in self-amplified spontaneous emission mode at full energy of >1 mJ with a 120 Hz repetition rate, obtaining a resolving power of Ε/δΕ > 3 × 10⁴. In conclusion, the device was also used to monitor the effects of pulse duration down to 8 fs by analysis of the spectral spike width.

View Accepted Manuscript (DOE)

Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1228043

Alternate ID(s):: OSTI ID: 1234727

Journal Information:: Optica, Journal Name: Optica Journal Issue: 10 Vol. 2; ISSN 2334-2536

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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Short-wavelength free-electron laser sources and science: a review Seddon, E. A.; Clarke, J. A.; Dunning, D. J. Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-00596	text	January 2017
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SwissFEL: The Swiss X-ray Free Electron Laser Milne, Christopher; Schietinger, Thomas; Aiba, Masamitsu Applied Sciences, Vol. 7, Issue 7 https://doi.org/10.3390/app7070720	journal	July 2017
Perspective: Opportunities for ultrafast science at SwissFEL Abela, Rafael; Beaud, Paul; Van Bokhoven, Jeroen A. ETH Zurich https://doi.org/10.3929/ethz-b-000231826	text	January 2017
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Perspective: Opportunities for ultrafast science at SwissFEL Abela, Rafael; Beaud, Paul; Van Bokhoven, Jeroen A. AIP Publishing https://doi.org/10.7892/boris.114739	text	January 2017

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