MgZnO High Voltage Thin Film Transistors on Glass for Inverters in Building Integrated Photovoltaics
- Rutgers Univ., Piscataway, NJ (United States). Dept. of Electrical and Computer Engineering
- Zhejiang Univ., Hangzhou (China). College of Electrical Engineering
Building integrated photovoltaics (BIPV) have attracted considerable interests because of its aesthetically attractive appearance and overall low cost. In BIPV, system integration on a glass substrate like windows is essential to cover a large area of a building with low cost. But, the conventional high voltage devices in inverters have to be built on the specially selected single crystal substrates, limiting its application for large area electronic systems, such as the BIPV. We demonstrate a Magnesium Zinc Oxide (MZO) based high voltage thin film transistor (HVTFT) built on a transparent glass substrate. We designed devices with unique ring-type structures and use modulated Mg doping in the channel - gate dielectric interface, resulting in a blocking voltage of over 600 V. In addition to BIPV, the MZO HVTFT based inverter technology also creates new opportunities for emerging self-powered smart glass.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC00112704
- OSTI ID:
- 1349569
- Report Number(s):
- BNL-113698-2017-JA; KC0403020
- Journal Information:
- Scientific Reports, Vol. 6, Issue 1; ISSN 2045-2322
- Publisher:
- Nature Publishing GroupCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Self-aligned photolithography for the fabrication of fully transparent high-voltage devices
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journal | April 2018 |
Yttrium zinc tin oxide high voltage thin film transistors
|
journal | September 2018 |
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