Imaging latex–carbon nanotube composites by subsurface electrostatic force microscopy
- Sandia National Lab. (SNL-CA), Livermore, CA (United States); Univ. of California, Berkeley, CA (United States)
- Sandia National Lab. (SNL-CA), Livermore, CA (United States); Naval Post Graduate School, Monterey, CA (United States)
- Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Electrostatic modes of atomic force microscopy have shown to be non-destructive and relatively simple methods for imaging conductors embedded in insulating polymers. Here we use electrostatic force microscopy to image the dispersion of carbon nanotubes in a latex-based conductive composite, which brings forth features not observed in previously studied systems employing linear polymer films. A fixed-potential model of the probe-nanotube electrostatics is presented which in principle gives access to the conductive nanoparticle's depth and radius, and the polymer film dielectric constant. Comparing this model to the data results in nanotube depths that appear to be slightly above the film–air interface. Furthermore, this result suggests that water-mediated charge build-up at the film–air interface may be the source of electrostatic phase contrast in ambient conditions.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1332173
- Report Number(s):
- SAND-2016-7751J; 646511; TRN: US1700172
- Journal Information:
- Nanotechnology, Vol. 27, Issue 41; ISSN 0957-4484
- Publisher:
- IOP PublishingCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Dielectric nanotomography based on electrostatic force microscopy: A numerical analysis
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journal | January 2020 |
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