Detection of Percolating Paths in PMMA/CB Segregated Network Composites Using Electrostatic Force Microscopy and Conductive Atomic Force Microscopy

Journal Article · Thu Jan 01 04:00:00 EST 2009 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3265742· OSTI ID:970895

Waddell, J. ^[1]; Ou, R. ^[1]; Gupta, S. ^[1]; Parker, A. ^[1]; Gerhardt, Dr. Rosario ^[1]; Seal, Katyayani ^[2]; Kalinin, Sergei V ^[2]; Baddorf, Arthur P ^[2]

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1. Georgia Institute of Technology
2. ORNL

Composite specimens possessing polyhedral segregated network microstructures require a very small amount of nanosize filler, <1 vol %, to reach percolation because percolation occurs by accumulation of the fillers along the edges of the deformed polymer matrix particles. In this paper, electrostatic force microscopy (EFM) and conductive atomic force microscopy (C-AFM) were used to confirm the location of the nanosize fillers and the corresponding percolating paths in polymethyl methacrylate/carbon black composites. The EFM and C-AFM images revealed that the polyhedral polymer particles were coated with filler, primarily on the edges as predicted by the geometric models provided.

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 970895
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 23 Vol. 95; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ATOMIC FORCE MICROSCOPY
DETECTION
ELECTROSTATICS
FILLERS
MICROSCOPY
POLYMERS
carbon black C-AFM EFM