Device and method for creating Gaussian aberration-corrected electron beams

McMorran, Benjamin; Linck, Martin

Title: Device and method for creating Gaussian aberration-corrected electron beams

Patent · Tue Jan 19 00:00:00 EST 2016

OSTI ID:1236003

McMorran, Benjamin; Linck, Martin

Electron beam phase gratings have phase profiles that produce a diffracted beam having a Gaussian or other selected intensity profile. Phase profiles can also be selected to correct or compensate electron lens aberrations. Typically, a low diffraction order produces a suitable phase profile, and other orders are discarded.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-05CH11231

Assignee:: University of Oregon

Patent Number(s):: 9,240,255

Application Number:: 14/199,947

OSTI ID:: 1236003

Resource Relation:: Patent File Date: 2014 Mar 06

Country of Publication:: United States

Language:: English

References (7)

Imaging and focusing of neutrons by a zone plate Kearney, P. D.; Klein, A. G.; Opat, G. I. Nature, Vol. 287, Issue 5780 https://doi.org/10.1038/287313a0	journal	September 1980
Grain size determination in nano-scale polycrystalline aggregates by precession illumination-hollow cone dark field imaging in the transmission electron microscope Kulovits, A. K.; Facco, G.; Wiezorek, J. M. K. Materials Characterization, Vol. 63, p. 17-26 https://doi.org/10.1016/j.matchar.2011.10.003	journal	January 2012
Electron Vortex Beams with High Quanta of Orbital Angular Momentum McMorran, B. J.; Agrawal, A.; Anderson, I. M. Science, Vol. 331, Issue 6014, p. 192-195 https://doi.org/10.1126/science.1198804	journal	January 2011
Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope Moeck, Peter; Rouvimov, Sergei; Hausler, Ines 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO), 2011 11th IEEE International Conference on Nanotechnology https://doi.org/10.1109/NANO.2011.6144300	conference	August 2011
Phase mask with spatially variable diffraction efficiency Ehbets, Peter; Poirier, Michel; Xu, Zhihong https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6545808 US Patent Document 6,545,808	patent	April 2003
System and method for producing and using multiple electron beams with quantized orbital angular momentum in an electron microscope McMorran, Benjamin https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20120153144 US Patent Application 13/372914; 20120153144	patent-application	June 2012
Phase Plate Blackburn, Arthur https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20130193322 US Patent Application 13/726260; 20130193322	patent-application	August 2013

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