Ultrafast scanning probe microscopy

Conference · Sat Jan 01 00:00:00 EST 1994

OSTI ID:10179420

Botkin, D; Weiss, S; Ogletree, D F; Salmeron, M; Chemla, D S

The authors have developed a general technique which combines the temporal resolution of ultrafast laser spectroscopy with the spatial resolution of scanned probe microscopy (SPM). Using this technique with scanning tunneling microscopy (STM), they have obtained simultaneous 2 ps time resolution and 50 {angstrom} spatial resolution. This improves the time resolution currently attainable with STM by nine orders of magnitude. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution is discussed.

• Research Organization: Lawrence Berkeley Lab., CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 10179420
• Report Number(s): LBL-35089; CONF-940142-46; ON: DE94018186; TRN: 94:008101
• Resource Relation: Conference: OE/LASE `94: conference on optics, electro-optics, and laser applications in science and engineering,Los Angeles, CA (United States),22-29 Jan 1994; Other Information: PBD: Jan 1994
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
ELECTRON MICROPROBE ANALYSIS
TIME RESOLUTION
LASER SPECTROSCOPY
440800
MISCELLANEOUS INSTRUMENTATION