Ultrafast scanning probe microscopy

Journal Article · Mon Nov 01 00:00:00 EST 1993 · Applied Physics Letters; (United States)

DOI:https://doi.org/10.1063/1.110435· OSTI ID:6070824

Weiss, S; Ogletree, D F; Botkin, D; Salmeron, M; Chemla, D S ^[1]

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1. Department of Physics, University of California at Berkeley (United States) Materials Sciences Division, MS 2-300, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)

We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-A spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6070824
• Journal Information: Applied Physics Letters; (United States), Vol. 63:18; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
SCANNING ELECTRON MICROSCOPY
TIME RESOLUTION
LASER RADIATION
PHOTO-INDUCED TRANSIENT SPECTROSCOPY
PULSED IRRADIATION
SOLIDS
SPATIAL RESOLUTION
SURFACE PROPERTIES
TUNNELING
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
IRRADIATION
MICROSCOPY
RADIATIONS
RESOLUTION
SPECTROSCOPY
TIMING PROPERTIES
440800* - Miscellaneous Instrumentation- (1990-)
661300 - Other Aspects of Physical Science- (1992-)