CRRES microelectronics test package (MEP)

Journal Article · Thu Apr 01 00:00:00 EST 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.212346· OSTI ID:6535561

Mullen, E G; Ray, K P ^[1]

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1. PL/GPSP, Hanscom AFB, MA (United States)

The Microelectronics Test Package (MEP) flown on board the Combined Release and Radiation Effects Satellite (CRRES) contained over 60 device types and approximately 400 total devices which were tested for both single event upset (SEU) and total dose (parametric degradation and annealing). A description of the experiment, the method of testing devices, and the structure of data acquisition are presented. Sample flight data are shown. These included SEUs from a GaAs 1 K RAM during the March 1991 solar flare, and a comparison between passive shielding and a specially designed spot shielding package.

• OSTI ID: 6535561
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 40:2; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC EQUIPMENT
PHYSICAL RADIATION EFFECTS
COMPARATIVE EVALUATIONS
DATA ACQUISITION
FAILURES
FLIGHT TESTING
MEMORY DEVICES
MICROELECTRONICS
SATELLITES
SHIELDING
SOLAR FLARES
SPACE FLIGHT
EQUIPMENT
EVALUATION
RADIATION EFFECTS
SOLAR ACTIVITY
TESTING
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems