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Title: Nucleation and growth mechanisms in ion-plated TiN films on steel substrates

Conference ·

Cross-sectional transmission electron microscopy (XTEM) was used to investigate the nucleation and growth characteristics of TiN films, ion plated on tool and stainless steel substrates with and without an {alpha}-Ti underlayer ({approx}100 nm thick). It was found that (1) at lower deposition temperatures, the underlayer {alpha}-Ti remains unchanged and exhibits a layer + island growth mode; (2) at higher deposition temperatures, the underlayer may transform into a TiC phase on M50 steel and into a {delta}{prime}-TiN phase on 316L stainless steel; (3) the growth behavior of TiN films was controlled primarily by the reaction thermodynamics and diffusion kinetics of Ti and N adatoms. Based on microscopic evidence together with the kinetic and thermodynamic considerations a mechanistic model is presented to describe the nucleation and growth mechanisms of ion-plated TiN films under the deposition conditions explored in this study. 20 refs., 4 figs.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5650903
Report Number(s):
CONF-890468-13; ON: DE90002269
Resource Relation:
Journal Volume: 41; Journal Issue: 3; Conference: 16. international conference on metallurgical coatings and equipment exhibit, San Diego, CA (USA), 17-21 Apr 1989
Country of Publication:
United States
Language:
English