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Title: Multilayer diffraction grating

Patent Application ·
OSTI ID:5482154

This invention is for a reflection diffraction grating that functions at x-ray to VUV wavelengths and at normal angles of incidence. The novel grating is comprised of a laminar grating of period D with flat-topped grating bars. A multiplicity of layered synthetic microstructures, of period d and comprised of alternating flat layers of two different materials, are disposed on the tops of the grating bars of the laminar grating. In another embodiment of the grating, a second multiplicity of layered synthetic microstructures are also disposed on the flat faces, of the base of the grating, between the bars. D is in the approximate range from 3000 to 50,000 Angstroms, but d is in the approximate range from 10 to 400 Angstroms. The laminar grating and the layered microstructures cooperatively interact to provide many novel and beneficial instrumentational advantages. 2 figs.

Research Organization:
Lawrence Livermore National Lab., CA (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-48
Assignee:
Dept. of Energy
Patent Number(s):
PATENTS-US-A7259564
Application Number:
ON: DE91016976; PPN: US 7-259564
OSTI ID:
5482154
Country of Publication:
United States
Language:
English