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Title: First observations of power MOSFET burnout with high energy neutrons

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.556885· OSTI ID:445458
; ; ;  [1];  [2]
  1. Boeing Defense and Space Group, Seattle, WA (United States)
  2. Los Alamos National Lab., NM (United States)

Single event burnout was seen in power MOSFETs exposed to high energy neutrons. Devices with rated voltage {ge}400 volts exhibited burnout at substantially less than the rated voltage. Tests with high energy protons gave similar results. Burnout was also seen in limited tests with lower energy protons and neutrons. Correlations with heavy-ion data are discussed. Accelerator proton data gave favorable comparisons with burnout rates measured on the APEX spacecraft. Implications for burnout at lower altitudes are also discussed.

OSTI ID:
445458
Report Number(s):
CONF-960773-; ISSN 0018-9499; TRN: 97:005143
Journal Information:
IEEE Transactions on Nuclear Science, Vol. 43, Issue 6Pt1; Conference: Institute of Electrical and Electronics Engineers/Nuclear and Space Radiation Effects conference (NSREC `96), Indian Wells, CA (United States), 15-19 Jul 1996; Other Information: PBD: Dec 1996
Country of Publication:
United States
Language:
English

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