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Title: Formation of titanium carbonitride film by laser treatment: Structural and transport properties

In-plane and Out-of-plane Grazing incidence X-ray diffraction is used to characterize the preferred orientation present in the titanium carbonitride films using ADXRD beamline at INDUS 2 synchrotron radiation source. GIXRD shows the formation of mixture of FCCTiC{sub x}N{sub (1-x)} films for different values of x along with the solid solution. From the in-plane and out-of-plane XRD measurements, we have observed that a specific texture along the c-axis of Ti has been formed during the laser treatment process. Due to the diffusion of C and N into Ti, the resistance of the specimen has been decreases with respect to the resistance of pure Ti sheet. The formed phases are stable and there is no structural relaxation has been observed during annealing process.
Authors:
; ;  [1] ;  [2]
  1. School of Instrumentation, Devi Ahilya University, Khandwa Road, Indore-452001 (India)
  2. Indus Synchrotron Utilization Division, Raja Ramanna Center for Advanced Technology, Indore-452013 (India)
Publication Date:
OSTI Identifier:
22490418
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; DIFFUSION; FCC LATTICES; FILMS; GRAIN ORIENTATION; INDUS-2; LASER RADIATION; PHASE STABILITY; RELAXATION; SHEETS; SOLID SOLUTIONS; SYNCHROTRON RADIATION; TEXTURE; TITANIUM; TITANIUM CARBIDES; TITANIUM NITRIDES; X-RAY DIFFRACTION