GIXRD measurements at EDXRD beamline at INDUS-2 synchrotron

Journal Article · Tue Jun 05 04:00:00 EDT 2012 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4710089· OSTI ID:22004098

Pandey, K K; Kumar, Dileep; Dwivedi, Abhilash; Gupta, Ajay; Sharma, Surinder M ^[1]

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1. Bhabha Atomic Research Centre, Trombay, Mumbai-400 085 (India) and UGC-DAE Consortium for Scientific Research, Indore, University Campus, Khandwa Road, Indore-452 017 (India)

The energy dispersive x-ray diffraction (EDXRD) beam line at beam port no. BL-11, INDUS-2, RRCAT (Indore) has been adapted for grazing incidence x-ray diffraction (GIXRD) measurements in both out-of plane and in-plane geometry. With the help of energy sensitive high resolution HPGe detector, we have been able to record diffraction data from thin films of thicknesses ranging from few nanometers to hundreds of nanometers. We are presenting here a few demonstrative examples to illustrate the capabilities and possible implications of EDXRD beamline in carrying out structural investigations of thin films.

• OSTI ID: 22004098
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1447; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BEAM TRANSPORT
CRYSTAL STRUCTURE
HIGH-PURITY GE DETECTORS
INDUS-2
RESOLUTION
SMALL ANGLE SCATTERING
SYNCHROTRONS
THIN FILMS
X-RAY DIFFRACTION