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Title: Growth and optical characteristics of high-quality ZnO thin films on graphene layers

We report the growth of high-quality, smooth, and flat ZnO thin films on graphene layers and their photoluminescence (PL) characteristics. For the growth of high-quality ZnO thin films on graphene layers, ZnO nanowalls were grown using metal-organic vapor-phase epitaxy on oxygen-plasma treated graphene layers as an intermediate layer. PL measurements were conducted at low temperatures to examine strong near-band-edge emission peaks. The full-width-at-half-maximum value of the dominant PL emission peak was as narrow as 4 meV at T = 11 K, comparable to that of the best-quality films reported previously. Furthermore, the stimulated emission of ZnO thin films on the graphene layers was observed at the low excitation energy of 180 kW/cm{sup 2} at room temperature. Their structural and optical characteristics were investigated using X-ray diffraction, transmission electron microscopy, and PL spectroscopy.
Authors:
; ; ; ;  [1] ;  [2] ; ;  [3] ;  [4]
  1. Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul 151-747 (Korea, Republic of)
  2. Advanced Development Team, LED Business, Samsung Electronics Co., Ltd., San#24 Nongseo-Dong, Giheung-Gu, Yongin-City, Gyeonggi-Do 446–711 (Korea, Republic of)
  3. Department of Materials Science and Engineering, Seoul National University, Seoul 151–744 (Korea, Republic of)
  4. Department of Physics and Chemistry, Korea Military Academy, Seoul (Korea, Republic of)
Publication Date:
OSTI Identifier:
22415244
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL materials; Journal Volume: 3; Journal Issue: 1; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COMPARATIVE EVALUATIONS; EMISSION SPECTROSCOPY; EXCITATION; GRAPHENE; LAYERS; ORGANOMETALLIC COMPOUNDS; PHOTOLUMINESCENCE; PLASMA; STIMULATED EMISSION; TEMPERATURE DEPENDENCE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR PHASE EPITAXY; X-RAY DIFFRACTION; ZINC OXIDES