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Title: Optimal growth and thermal stability of crystalline Be{sub 0.25}Zn{sub 0.75}O alloy films on Al{sub 2}O{sub 3}(0001)

The influence of growth temperature on the synthesis of Be{sub x}Zn{sub 1−x}O alloy films, grown on highly-mismatched Al{sub 2}O{sub 3}(0001) substrates, was studied by synchrotron x-ray scattering, high-resolution transmission electron microscopy and photoluminescence measurements. A single-phase Be{sub x}Zn{sub 1−x}O alloy with a Be concentration of x = 0.25, was obtained at the growth temperature, T{sub g} = 400 °C, and verified by high-resolution transmission electron microscopy. It was found that high-temperature growth, T{sub g}≥600 °C, caused phase separation, resulting in a random distribution of intermixed alloy phases. The inhomogeneity and structural fluctuations observed in the Be{sub x}Zn{sub 1−x}O films grown at high temperatures are attributed to a variation in Be composition and mosaic distribution via atomic displacement and strain relaxation.
Authors:
; ; ; ;  [1] ;  [2] ;  [3] ;  [4]
  1. Department of Physics, University of Warwick, Coventry CV4 7AL (United Kingdom)
  2. School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University, Jeonju 561-756 (Korea, Republic of)
  3. Department of Materials Science and Engineering, Kyungpook National University, Sangju 742-711 (Korea, Republic of)
  4. Pohang Accelerator Laboratory, POSTECH, Pohang 790-784 (Korea, Republic of)
Publication Date:
OSTI Identifier:
22261589
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 14; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ALLOYS; ALUMINIUM OXIDES; ATOMIC DISPLACEMENTS; CRYSTAL GROWTH; FILMS; FLUCTUATIONS; PHOTOLUMINESCENCE; TEMPERATURE RANGE 0400-1000 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION