The effect of irradiation with high-energy protons on 4H-SiC detectors
- Institute of Physics (Lithuania)
- Vilnius University, Semiconductor Physics Department and Institute of Materials Science and Applied Research (Lithuania)
The effect of irradiation of 4H-SiC ionizing-radiation detectors with various doses (as high as 10{sup 16} cm{sup -2}) of 24-GeV protons is studied. Isotopes of B, Be, Li, He, and H were produced in the nuclear spallation reactions of protons with carbon. Isotopes of Al, Mg, Na, Ne, F, O, and N were produced in the reactions of protons with silicon. The total amount of the produced stable isotopes varied in proportion with the radiation dose from 1.2 x 10{sup 11} to 5.9 x 10{sup 13} cm{sup -2}. It is shown that, at high radiation doses, the contact characteristics of the detectors change appreciably. The potential-barrier height increased from the initial value of 0.7-0.75 eV to 0.85 eV; the rectifying characteristics of the Schottky contacts deteriorated appreciably. These effects are attributed to the formation of a disordered structure of the material as a result of irradiation.
- OSTI ID:
- 21088097
- Journal Information:
- Semiconductors, Vol. 41, Issue 3; Other Information: DOI: 10.1134/S1063782607030190; Copyright (c) 2007 Nauka/Interperiodica; Article Copyright (c) 2007 Pleiades Publishing, Ltd; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
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