Friction of ice measured using lateral force microscopy

Journal Article · Wed Mar 15 00:00:00 EST 2000 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.61.7760· OSTI ID:20215757

Bluhm, Hendrik ^[1]; Inoue, Takahito ^[1]; Salmeron, Miquel ^[1]

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1. Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)

The friction of nanometer thin ice films grown on mica substrates is investigated using atomic force microscopy (AFM). Friction was found to be of similar magnitude as the static friction of ice reported in macroscopic experiments. The possible existence of a lubricating film of water due to pressure melting, frictional heating, and surface premelting is discussed based on the experimental results using noncontact, contact, and lateral force microscopy. We conclude that AFM measures the dry friction of ice due to the low scan speed and the squeezing out of the water layer between the sharp AFM tip and the ice surface. (c) 2000 The American Physical Society.

• OSTI ID: 20215757
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Vol. 61, Issue 11; Other Information: PBD: 15 Mar 2000; ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ICE
THIN FILMS
FRICTION
MICROSCOPY
MICA
EXPERIMENTAL DATA