Growth of nanometer thin ice films from water vapor studied using scanning polarization force microscopy

Journal Article · Fri Oct 01 04:00:00 EDT 1999 · Journal of Chemical Physics

DOI:https://doi.org/10.1063/1.479987· OSTI ID:689944

Bluhm, H; Salmeron, M ^[1]

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1. Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)

Atomic force microscopy (AFM) was used to study the growth and morphology of ice films on the cleavage surface of mica. Measurements performed in contact, as well as in noncontact operation modes of the microscope, allowed us to distinguish the solid and liquid parts of the film. At temperatures below {minus}30&hthinsp;{degree}C, supercooled water droplets formed on top of a thin (nanometer range) ice layer in contact with the substrate. After annealing, a contiguous flat film was formed. Between {minus}20 and {minus}10&hthinsp;{degree}C and at a relative humidity of {approximately}83{percent}, the film consisted of a solid ice layer {approximately}7 {Angstrom} thick, covered by a liquid-like layer 50{plus_minus}5&hthinsp;{Angstrom} thick. When the temperature was raised above 0&hthinsp;{degree}C, droplets formed, which subsequently evaporated. Comparison of results obtained in the various AFM operation modes allowed us to conclude the existence of a liquid-like layer on the ice surface. {copyright} {ital 1999 American Institute of Physics.}

• OSTI ID: 689944
• Journal Information: Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 15 Vol. 111; ISSN JCPSA6; ISSN 0021-9606
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ANNEALING
ATOMIC FORCE MICROSCOPY
GROWTH
ICE
LAYERS
LIQUIDS
MICA
MORPHOLOGY
THIN FILMS