The Study of Contact, Adhesion and Friction at the Atomic Scale by Atomic Force Microscopy
- Univ. of California, Berkeley, CA (United States); Materials Sciences Division CAM
The physical behavior of materials in contact with one another is generally not understood at the atomic level. In an attempt to quantitatively elucidate the fundamental mechanisms involved in contact, friction, and adhesion, atomic force microscopy (AFM) studies in ultrahigh vacuum (UHV) were performed with various single crystal samples. With low applied loads, the sharp tip on the end of the AFM cantilever forms a nanometer-sized single asperity contact with a sample. Adhesion, loading, and friction forces acting between the tip and each sample were measured for these ideal contacts. To perform the experiments, a novel UHV AFM was designed, built and characterized. The instrument is the first variable temperature UHV AFM, and allows flexibility for sample exchange, AFM measurement positioning, and surface science investigations of the sample.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research (ER)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 764716
- Report Number(s):
- LBNL--41206
- Country of Publication:
- United States
- Language:
- English
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