Facile fabrication of 2D material multilayers and vdW heterostructures with multimodal microscopy and AFM characterization
Abstract
Reliable transfer processes that enable manipulation of two-dimensional (2D) materials, e.g., transition metal dichalcogenides (TMDCs) and MXenes, from one substrate to another has been a necessity for successful device fabrication. Here, with both mechanical exfoliation and chemical vapor deposition (CVD) widely used, a versatile, clean, deterministic, and yet simple transfer technique is highly needed. To address such need, we developed a transfer method that takes advantage of wettability contrast between interfaces without the use of sacrificial layers or chemical processes. More importantly, a setup was developed to carry out this transfer method with high sample selectivity and fine control of the position and orientation of transferred TMDC crystals, a feature required for fabrication of the devices based on vertical 2D heterostructures. Using both exfoliated and CVD grown materials and subsequent atomic force microscopy (AFM), photoluminescence (PL), confocal Raman and tip enhanced Raman spectroscopy (TERS) characterization, we ascertained the quality of interfaces resulting from the transfer process while preserving excellent 2D material integrity. PL and TERS maps revealed nanometer-scale heterogeneities in the interfaces of fabricated heterostructures, which should enable further perfection of the transfer technique. TERS/TEPL information were employed to identify areas suitable for nanodevice fabrication, making the reported transfer andmore »
- Authors:
-
- Northwestern University, Evanston, IL (United States)
- Rice University, Houston, TX (United States)
- Horiba Scientific, Novato, CA (United States)
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States). Center for Nanoscale Materials (CNM)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); Army Research Office (ARO)
- OSTI Identifier:
- 1981705
- Grant/Contract Number:
- AC02-06CH11357; W911NF1510068
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Materials Today
- Additional Journal Information:
- Journal Volume: 52; Journal Issue: C; Journal ID: ISSN 1369-7021
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Materials Science; 2D materials; 2D material transfer; Van der Waals heterostructure; Tip-enhanced Raman spectroscopy
Citation Formats
Dong, Siyan, Zhang, Xiang, Nathamgari, S. Shiva. P., Krayev, Andrey, Zhang, Xu, Hwang, Jin Wook, Ajayan, Pulickel M., and Espinosa, Horacio D. Facile fabrication of 2D material multilayers and vdW heterostructures with multimodal microscopy and AFM characterization. United States: N. p., 2022.
Web. doi:10.1016/j.mattod.2022.01.002.
Dong, Siyan, Zhang, Xiang, Nathamgari, S. Shiva. P., Krayev, Andrey, Zhang, Xu, Hwang, Jin Wook, Ajayan, Pulickel M., & Espinosa, Horacio D. Facile fabrication of 2D material multilayers and vdW heterostructures with multimodal microscopy and AFM characterization. United States. https://doi.org/10.1016/j.mattod.2022.01.002
Dong, Siyan, Zhang, Xiang, Nathamgari, S. Shiva. P., Krayev, Andrey, Zhang, Xu, Hwang, Jin Wook, Ajayan, Pulickel M., and Espinosa, Horacio D. Wed .
"Facile fabrication of 2D material multilayers and vdW heterostructures with multimodal microscopy and AFM characterization". United States. https://doi.org/10.1016/j.mattod.2022.01.002. https://www.osti.gov/servlets/purl/1981705.
@article{osti_1981705,
title = {Facile fabrication of 2D material multilayers and vdW heterostructures with multimodal microscopy and AFM characterization},
author = {Dong, Siyan and Zhang, Xiang and Nathamgari, S. Shiva. P. and Krayev, Andrey and Zhang, Xu and Hwang, Jin Wook and Ajayan, Pulickel M. and Espinosa, Horacio D.},
abstractNote = {Reliable transfer processes that enable manipulation of two-dimensional (2D) materials, e.g., transition metal dichalcogenides (TMDCs) and MXenes, from one substrate to another has been a necessity for successful device fabrication. Here, with both mechanical exfoliation and chemical vapor deposition (CVD) widely used, a versatile, clean, deterministic, and yet simple transfer technique is highly needed. To address such need, we developed a transfer method that takes advantage of wettability contrast between interfaces without the use of sacrificial layers or chemical processes. More importantly, a setup was developed to carry out this transfer method with high sample selectivity and fine control of the position and orientation of transferred TMDC crystals, a feature required for fabrication of the devices based on vertical 2D heterostructures. Using both exfoliated and CVD grown materials and subsequent atomic force microscopy (AFM), photoluminescence (PL), confocal Raman and tip enhanced Raman spectroscopy (TERS) characterization, we ascertained the quality of interfaces resulting from the transfer process while preserving excellent 2D material integrity. PL and TERS maps revealed nanometer-scale heterogeneities in the interfaces of fabricated heterostructures, which should enable further perfection of the transfer technique. TERS/TEPL information were employed to identify areas suitable for nanodevice fabrication, making the reported transfer and characterization methods ideal for making high quality assembly of 2D heterostructure more accessible, which should facilitate exploration of vertical 2D heterostructures for applications in electronics, batteries, solar cells, and twistronics.},
doi = {10.1016/j.mattod.2022.01.002},
journal = {Materials Today},
number = C,
volume = 52,
place = {United States},
year = {Wed Jan 26 00:00:00 EST 2022},
month = {Wed Jan 26 00:00:00 EST 2022}
}
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