Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis
Abstract
Atomic force microscopy is an analytical characterization method that is able to image a sample’s surface topography at high resolution while simultaneously probing a variety of different sample properties. Such properties include tip-sample interactions, the local measurement of which has gained much popularity in recent years. To this end, either the oscillation frequency or the oscillation amplitude and phase of the vibrating force-sensing cantilever are recorded as a function of tip-sample distance and subsequently converted into quantitative values for the force or interaction potential. Here, we theoretically and experimentally show that the force law obtained from such data acquired under vacuum conditions using the most commonly applied methods may deviate more than previously assumed from the actual interaction when the oscillation amplitude of the probe is of the order of the decay length of the force near the surface, which may result in a non-negligible error if correct absolute values are of importance. Caused by approximations made in the development of the mathematical reconstruction procedures, the related inaccuracies can be effectively suppressed by using oscillation amplitudes sufficiently larger than the decay length. To facilitate efficient data acquisition, we propose a technique that includes modulating the drive amplitude at a constantmore »
- Authors:
-
- Yale Univ., New Haven, CT (United States). Dept. of Mechanical Engineering and Materials Science
- Yale Univ., New Haven, CT (United States). Dept. of Chemical and Environmental Engineering
- Publication Date:
- Research Org.:
- Yale Univ., New Haven, CT (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC); National Science Foundation (NSF)
- OSTI Identifier:
- 1540708
- Alternate Identifier(s):
- OSTI ID: 1434835
- Grant/Contract Number:
- SC0016179; CHE-1608568; DMR-1119826.
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Physical Review Applied
- Additional Journal Information:
- Journal Volume: 9; Journal Issue: 4; Journal ID: ISSN 2331-7019
- Publisher:
- American Physical Society (APS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; 36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Physics
Citation Formats
Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., and Schwarz, Udo D. Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis. United States: N. p., 2018.
Web. doi:10.1103/physrevapplied.9.044040.
Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., & Schwarz, Udo D. Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis. United States. https://doi.org/10.1103/physrevapplied.9.044040
Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., and Schwarz, Udo D. Thu .
"Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis". United States. https://doi.org/10.1103/physrevapplied.9.044040. https://www.osti.gov/servlets/purl/1540708.
@article{osti_1540708,
title = {Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis},
author = {Dagdeviren, Omur E. and Zhou, Chao and Altman, Eric I. and Schwarz, Udo D.},
abstractNote = {Atomic force microscopy is an analytical characterization method that is able to image a sample’s surface topography at high resolution while simultaneously probing a variety of different sample properties. Such properties include tip-sample interactions, the local measurement of which has gained much popularity in recent years. To this end, either the oscillation frequency or the oscillation amplitude and phase of the vibrating force-sensing cantilever are recorded as a function of tip-sample distance and subsequently converted into quantitative values for the force or interaction potential. Here, we theoretically and experimentally show that the force law obtained from such data acquired under vacuum conditions using the most commonly applied methods may deviate more than previously assumed from the actual interaction when the oscillation amplitude of the probe is of the order of the decay length of the force near the surface, which may result in a non-negligible error if correct absolute values are of importance. Caused by approximations made in the development of the mathematical reconstruction procedures, the related inaccuracies can be effectively suppressed by using oscillation amplitudes sufficiently larger than the decay length. To facilitate efficient data acquisition, we propose a technique that includes modulating the drive amplitude at a constant height from the surface while monitoring the oscillation amplitude and phase. Ultimately, such an amplitude-sweep-based force spectroscopy enables shorter data acquisition times and increased accuracy for quantitative chemical characterization compared to standard approaches that vary the tip-sample distance. An additional advantage is that since no feedback loop is active while executing the amplitude sweep, the force can be consistently recovered deep into the repulsive regime.},
doi = {10.1103/physrevapplied.9.044040},
journal = {Physical Review Applied},
number = 4,
volume = 9,
place = {United States},
year = {Thu Apr 26 00:00:00 EDT 2018},
month = {Thu Apr 26 00:00:00 EDT 2018}
}
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