Methodology for Wide Band-Gap Device Dynamic Characterization

Zhang, Zheyu; Guo, Ben; Wang, Fei Fred; Jones, Edward A.; Tolbert, Leon M.; Blalock, Benjamin J.

doi:10.1109/TPEL.2017.2655491

Title: Methodology for Wide Band-Gap Device Dynamic Characterization

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Abstract

Here, the double pulse test (DPT) is a widely accepted method to evaluate the dynamic behavior of power devices. Considering the high switching-speed capability of wide band-gap devices, the test results are very sensitive to the alignment of voltage and current (V-I) measurements. Also, because of the shoot-through current induced by Cdv/dt (i.e., cross-talk), the switching losses of the nonoperating switch device in a phase-leg must be considered in addition to the operating device. This paper summarizes the key issues of the DPT, including components and layout design, measurement considerations, grounding effects, and data processing. Additionally, a practical method is proposed for phase-leg switching loss evaluation by calculating the difference between the input energy supplied by a dc capacitor and the output energy stored in a load inductor. Based on a phase-leg power module built with 1200-V/50-A SiC MOSFETs, the test results show that this method can accurately evaluate the switching loss of both the upper and lower switches by detecting only one switching current and voltage, and it is immune to V-I timing misalignment errors.

Authors:

Zhang, Zheyu ^[1]; Guo, Ben ^[2]; Wang, Fei Fred ^[1]; Jones, Edward A. ^[1];

^[1]; Blalock, Benjamin J. ^[1]

The Univ. of Tennessee, Knoxville, TN (United States)
United Technologies Research Center, East Hartford, CT (United States)

Publication Date:: Thu Jan 19 00:00:00 EST 2017

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1399113

Grant/Contract Number:: AC05-00OR22725

Resource Type:: Accepted Manuscript

Journal Name:: IEEE Transactions on Power Electronics

Additional Journal Information:: Journal Volume: 32; Journal Issue: 12; Journal ID: ISSN 0885-8993

Publisher:: IEEE

Country of Publication:: United States

Language:: English

Subject:: 30 DIRECT ENERGY CONVERSION; double pulse test (DPT); dynamic characterization; phase-leg configuration wide bandgap

Citation Formats


                    Zhang, Zheyu, Guo, Ben, Wang, Fei Fred, Jones, Edward A., Tolbert, Leon M., and Blalock, Benjamin J. Methodology for Wide Band-Gap Device Dynamic Characterization.  United States: N. p., 2017. 
Web.  doi:10.1109/TPEL.2017.2655491.

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                    Zhang, Zheyu, Guo, Ben, Wang, Fei Fred, Jones, Edward A., Tolbert, Leon M., & Blalock, Benjamin J. Methodology for Wide Band-Gap Device Dynamic Characterization.  United States.  https://doi.org/10.1109/TPEL.2017.2655491

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                    Zhang, Zheyu, Guo, Ben, Wang, Fei Fred, Jones, Edward A., Tolbert, Leon M., and Blalock, Benjamin J. Thu .  
"Methodology for Wide Band-Gap Device Dynamic Characterization".  United States.  https://doi.org/10.1109/TPEL.2017.2655491.  https://www.osti.gov/servlets/purl/1399113.

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@article{osti_1399113,

  title        = {Methodology for Wide Band-Gap Device Dynamic Characterization},

  author       = {Zhang, Zheyu and Guo, Ben and Wang, Fei Fred and Jones, Edward A. and Tolbert, Leon M. and Blalock, Benjamin J.},

  abstractNote = {Here, the double pulse test (DPT) is a widely accepted method to evaluate the dynamic behavior of power devices. Considering the high switching-speed capability of wide band-gap devices, the test results are very sensitive to the alignment of voltage and current (V-I) measurements. Also, because of the shoot-through current induced by Cdv/dt (i.e., cross-talk), the switching losses of the nonoperating switch device in a phase-leg must be considered in addition to the operating device. This paper summarizes the key issues of the DPT, including components and layout design, measurement considerations, grounding effects, and data processing. Additionally, a practical method is proposed for phase-leg switching loss evaluation by calculating the difference between the input energy supplied by a dc capacitor and the output energy stored in a load inductor. Based on a phase-leg power module built with 1200-V/50-A SiC MOSFETs, the test results show that this method can accurately evaluate the switching loss of both the upper and lower switches by detecting only one switching current and voltage, and it is immune to V-I timing misalignment errors.},

  doi          = {10.1109/TPEL.2017.2655491},

  journal      = {IEEE Transactions on Power Electronics},

  number       = 12,

  volume       = 32,

  place        = {United States},

  year         = {Thu Jan 19 00:00:00 EST 2017},

  month        = {Thu Jan 19 00:00:00 EST 2017}

}

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