Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge
Abstract
An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25meV (FWHM) at 8981eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.
- Authors:
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1261158
- Grant/Contract Number:
- BMBF 05K13PE2k; BIDEB-2219
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Synchrotron Radiation (Online)
- Additional Journal Information:
- Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 22; Journal Issue: 4; Journal ID: ISSN 1600-5775
- Publisher:
- International Union of Crystallography
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; resonant inelastic X-ray scattering (RIXS); high energy-resolution; diced crystal analyzers; quartz
Citation Formats
Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, and Yavaş, Hasan. Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge. United States: N. p., 2015.
Web. doi:10.1107/s1600577515009686.
Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, & Yavaş, Hasan. Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge. United States. https://doi.org/10.1107/s1600577515009686
Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, and Yavaş, Hasan. Sat .
"Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge". United States. https://doi.org/10.1107/s1600577515009686. https://www.osti.gov/servlets/purl/1261158.
@article{osti_1261158,
title = {Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge},
author = {Ketenoglu, Didem and Harder, Manuel and Klementiev, Konstantin and Upton, Mary and Taherkhani, Mehran and Spiwek, Manfred and Dill, Frank-Uwe and Wille, Hans-Christian and Yavaş, Hasan},
abstractNote = {An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25meV (FWHM) at 8981eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.},
doi = {10.1107/s1600577515009686},
journal = {Journal of Synchrotron Radiation (Online)},
number = 4,
volume = 22,
place = {United States},
year = {Sat Jun 27 00:00:00 EDT 2015},
month = {Sat Jun 27 00:00:00 EDT 2015}
}
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