Search Menu
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information
Search Scholarly Publications

Title: Performance of quartz- and sapphire-based double-crystal high-resolution (~10 meV) RIXS monochromators under varying power loads

Abstract

In the context of a novel, high-resolution resonant inelastic X-ray scattering spectrometer, a flat-crystal-based quartz analyzer system has recently been demonstrated to provide an unprecedented intrinsic-energy resolution of 3.9 meV at the IrL3 absorption edge (11.215 keV) [Kimet al.(2018)Sci. Rep.8, 1958]. However, the overall instrument resolution was limited to 9.7 meV because of an 8.9 meV incident band pass, generated by the available high-resolution four-bounce Si(844) monochromator. In order to better match the potent resolving power of the novel analyzer with the energy band pass of the incident beam, a quartz(309)-based double-bounce, high-resolution monochromator was designed and implemented, expected to yield an overall instrument resolution of 6.0 meV. The choice of lower-symmetry quartz is very attractive because of its wealth of suitable near-backscattering reflections. However, it was found that during room-temperature operation typical levels of incident power, barely affecting the Si monochromator, caused substantial thermal distortions in the first crystal of the quartz monochromator, rendering it practically unusable. Finite-element analyses and heat-flow analyses corroborate this finding. As a high-flux, lower resolution (15.8 meV) alternative, a two-bounce sapphire(078) version was also tested and found to be less affected than quartz, but notably more than silicon.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [1]
+ Show Author Affiliations
  1. Argonne National Lab. (ANL), Lemont, IL (United States)
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  3. Max-Planck-Institut fuer Festkoerperforschung, Stuttgart (Germany)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1473620
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 4; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; non-traditional crystal materials; RIXS; high-resolution monochromators; resonant inelastic X-ray scattering; x-ray optics

Citation Formats

Gog, Thomas, Casa, Diego M., Knopp, Jonathan, Kim, Jungho, Upton, Mary H., Krakora, Richard, Jaski, Alan, Said, Ayman, Yavaş, Hasan, Gretarsson, Hlynur, and Huang, Xian Rong. Performance of quartz- and sapphire-based double-crystal high-resolution (~10 meV) RIXS monochromators under varying power loads. United States: N. p., 2018. Web. doi:10.1107/S1600577518005945.
Copy to clipboard
Gog, Thomas, Casa, Diego M., Knopp, Jonathan, Kim, Jungho, Upton, Mary H., Krakora, Richard, Jaski, Alan, Said, Ayman, Yavaş, Hasan, Gretarsson, Hlynur, & Huang, Xian Rong. Performance of quartz- and sapphire-based double-crystal high-resolution (~10 meV) RIXS monochromators under varying power loads. United States. https://doi.org/10.1107/S1600577518005945
Copy to clipboard
Gog, Thomas, Casa, Diego M., Knopp, Jonathan, Kim, Jungho, Upton, Mary H., Krakora, Richard, Jaski, Alan, Said, Ayman, Yavaş, Hasan, Gretarsson, Hlynur, and Huang, Xian Rong. Thu . "Performance of quartz- and sapphire-based double-crystal high-resolution (~10 meV) RIXS monochromators under varying power loads". United States. https://doi.org/10.1107/S1600577518005945. https://www.osti.gov/servlets/purl/1473620.
Copy to clipboard
@article{osti_1473620,
title = {Performance of quartz- and sapphire-based double-crystal high-resolution (~10 meV) RIXS monochromators under varying power loads},
author = {Gog, Thomas and Casa, Diego M. and Knopp, Jonathan and Kim, Jungho and Upton, Mary H. and Krakora, Richard and Jaski, Alan and Said, Ayman and Yavaş, Hasan and Gretarsson, Hlynur and Huang, Xian Rong},
abstractNote = {In the context of a novel, high-resolution resonant inelastic X-ray scattering spectrometer, a flat-crystal-based quartz analyzer system has recently been demonstrated to provide an unprecedented intrinsic-energy resolution of 3.9 meV at the IrL3 absorption edge (11.215 keV) [Kimet al.(2018)Sci. Rep.8, 1958]. However, the overall instrument resolution was limited to 9.7 meV because of an 8.9 meV incident band pass, generated by the available high-resolution four-bounce Si(844) monochromator. In order to better match the potent resolving power of the novel analyzer with the energy band pass of the incident beam, a quartz(309)-based double-bounce, high-resolution monochromator was designed and implemented, expected to yield an overall instrument resolution of 6.0 meV. The choice of lower-symmetry quartz is very attractive because of its wealth of suitable near-backscattering reflections. However, it was found that during room-temperature operation typical levels of incident power, barely affecting the Si monochromator, caused substantial thermal distortions in the first crystal of the quartz monochromator, rendering it practically unusable. Finite-element analyses and heat-flow analyses corroborate this finding. As a high-flux, lower resolution (15.8 meV) alternative, a two-bounce sapphire(078) version was also tested and found to be less affected than quartz, but notably more than silicon.},
doi = {10.1107/S1600577518005945},
journal = {Journal of Synchrotron Radiation (Online)},
number = 4,
volume = 25,
place = {United States},
year = {Thu May 31 00:00:00 EDT 2018},
month = {Thu May 31 00:00:00 EDT 2018}
}
Copy to clipboard
Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1107/S1600577518005945
Copyright Statement
Other availability
Search WorldCat Search WorldCat to find libraries that may hold this journal
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

Figures / Tables:

Figure 1 Figure 1: Dispersive arrangement of high-heat-load and high-resolution monochromators. Aluminium filters could be inserted between the two devices to reduce the power on the high-resolution monochromator.
All figures and tables (6 total)
Save / Share:
Export Metadata
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.

Works referenced in this record:

Anisotropic thermal conductivity
journal, July 1961

Examination of Bragg backscattering from crystalline quartz
journal, December 2005

  • Sutter, John P.; Baron, Alfred Q. R.; Ishikawa, Tetsuya
  • Journal of Physics and Chemistry of Solids, Vol. 66, Issue 12
  • DOI: 10.1016/j.jpcs.2005.09.044

High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering
journal, February 2018

  • Said, Ayman H.; Gog, Thomas; Wieczorek, Michael
  • Journal of Synchrotron Radiation, Vol. 25, Issue 2
  • DOI: 10.1107/S1600577517018185

Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm 2
journal, April 2006

  • Sutter, John P.; Baron, Alfred Q. R.; Miwa, Daigo
  • Journal of Synchrotron Radiation, Vol. 13, Issue 3
  • DOI: 10.1107/S0909049506003888

New materials for high-energy-resolution x-ray optics
journal, June 2017

  • Yavaş, Hasan; Sutter, John P.; Gog, Thomas
  • MRS Bulletin, Vol. 42, Issue 06
  • DOI: 10.1557/mrs.2017.94

Resonant inelastic x-ray scattering studies of elementary excitations
journal, June 2011

  • Ament, Luuk J. P.; van Veenendaal, Michel; Devereaux, Thomas P.
  • Reviews of Modern Physics, Vol. 83, Issue 2
  • DOI: 10.1103/RevModPhys.83.705

High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers
journal, June 2013

  • Hönnicke, Marcelo Goncalves; Huang, Xianrong; Cusatis, Cesar
  • Journal of Applied Crystallography, Vol. 46, Issue 4
  • DOI: 10.1107/S0021889813004731

Quartz-based flat-crystal resonant inelastic x-ray scattering spectrometer with sub-10 meV energy resolution
journal, January 2018

Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections
journal, November 2012

  • Gog, Thomas; Casa, Diego M.; Said, Ayman H.
  • Journal of Synchrotron Radiation, Vol. 20, Issue 1
  • DOI: 10.1107/S0909049512043154
    Sort by:
    [ × clear filter / sort ]

    Works referencing / citing this record:

    X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?
    journal, October 2019

    • Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond
    • Journal of Applied Crystallography, Vol. 52, Issue 6
    • DOI: 10.1107/s1600576719012925
      Sort by:
      [ × clear filter / sort ]

      Figures / Tables found in this record:

      Figure 1 (p. 8)figure
      Figure 2 (p. 9)figure
      Figure 3 (p. 10)figure
      Figure 4 (p. 11)figure
      Figure 5 (p. 12)figure
      Table 1 (p. 13)table
        [ × clear filter / sort ]
        Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.

        Similar Records in DOE PAGES and OSTI.GOV collections: