Magnetoresistance of Au films
Abstract
Measurement of the magnetoresistance (MR) of Au films as a function of temperature and film thickness reveals a strong dependence on grain size distribution and clear violation of the Kohler s rule. Using a model of random resistor network, we show that this result can be explained if the MR arises entirely from inhomogeneity due to grain boundary scattering and thermal activation of grain boundary atoms.
- Authors:
-
- Chinese Academy of Sciences (CAS), Beijing (China). Inst. of Physics
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1185612
- Alternate Identifier(s):
- OSTI ID: 1226595
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 116; Journal Issue: 22; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Zhang, D. L., Song, X. H., Zhang, X., and Zhang, Xiaoguang. Magnetoresistance of Au films. United States: N. p., 2014.
Web. doi:10.1063/1.4903953.
Zhang, D. L., Song, X. H., Zhang, X., & Zhang, Xiaoguang. Magnetoresistance of Au films. United States. https://doi.org/10.1063/1.4903953
Zhang, D. L., Song, X. H., Zhang, X., and Zhang, Xiaoguang. Wed .
"Magnetoresistance of Au films". United States. https://doi.org/10.1063/1.4903953. https://www.osti.gov/servlets/purl/1185612.
@article{osti_1185612,
title = {Magnetoresistance of Au films},
author = {Zhang, D. L. and Song, X. H. and Zhang, X. and Zhang, Xiaoguang},
abstractNote = {Measurement of the magnetoresistance (MR) of Au films as a function of temperature and film thickness reveals a strong dependence on grain size distribution and clear violation of the Kohler s rule. Using a model of random resistor network, we show that this result can be explained if the MR arises entirely from inhomogeneity due to grain boundary scattering and thermal activation of grain boundary atoms.},
doi = {10.1063/1.4903953},
journal = {Journal of Applied Physics},
number = 22,
volume = 116,
place = {United States},
year = {Wed Dec 10 00:00:00 EST 2014},
month = {Wed Dec 10 00:00:00 EST 2014}
}
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