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Title: Impact of doped barriers on the recombination coefficients of c -plane InGaN/GaN single quantum well light-emitting diodes

Abstract

Differential carrier lifetime measurements were performed on c-plane InGaN/GaN single quantum well (QW) light-emitting diodes (LEDs) of different QW indium compositions as well as with and without doped barriers. Mg-doped p-type and Si-doped n-type barriers close to the QW were used to reduce the net internal electric field in the QW, thereby improving the electron–hole wavefunction overlap on the LEDs. LEDs with doped barriers show short lifetimes and low carrier densities in the active region compared to the reference LEDs. The recombination coefficients in the ABC model were estimated based on the carrier lifetime and quantum efficiency measurements. The improvement in the radiative coefficients in the LEDs with doped barriers coupled with the blueshift of the emission wavelengths indeed indicates an enhancement in wavefunction overlap and a reduction of quantum confined Stark effect as a result of the reduced internal electric field. However, doped barriers also introduce non-radiative recombination centers and thereby increase the Shockley–Read–Hall (SRH) coefficient, although the increment is less for LEDs with high indium composition QWs. As a result, at high indium composition (22%), LEDs with doped barriers outperform the reference LEDs even though the trend is reversed for LEDs with lower indium composition (13.5%). Despite themore » trade-off of higher SRH coefficients, doped barriers are shown to be effective in reducing the internal electric field and increasing the recombination coefficients.« less

Authors:
ORCiD logo; ORCiD logo; ORCiD logo; ORCiD logo; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1896547
Grant/Contract Number:  
EE0008204; EE0009691; 2150283
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 121 Journal Issue: 18; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Chow, Y. C., Lynsky, C., Nakamura, S., DenBaars, S. P., Weisbuch, C., and Speck, J. S. Impact of doped barriers on the recombination coefficients of c -plane InGaN/GaN single quantum well light-emitting diodes. United States: N. p., 2022. Web. doi:10.1063/5.0117318.
Chow, Y. C., Lynsky, C., Nakamura, S., DenBaars, S. P., Weisbuch, C., & Speck, J. S. Impact of doped barriers on the recombination coefficients of c -plane InGaN/GaN single quantum well light-emitting diodes. United States. https://doi.org/10.1063/5.0117318
Chow, Y. C., Lynsky, C., Nakamura, S., DenBaars, S. P., Weisbuch, C., and Speck, J. S. Tue . "Impact of doped barriers on the recombination coefficients of c -plane InGaN/GaN single quantum well light-emitting diodes". United States. https://doi.org/10.1063/5.0117318.
@article{osti_1896547,
title = {Impact of doped barriers on the recombination coefficients of c -plane InGaN/GaN single quantum well light-emitting diodes},
author = {Chow, Y. C. and Lynsky, C. and Nakamura, S. and DenBaars, S. P. and Weisbuch, C. and Speck, J. S.},
abstractNote = {Differential carrier lifetime measurements were performed on c-plane InGaN/GaN single quantum well (QW) light-emitting diodes (LEDs) of different QW indium compositions as well as with and without doped barriers. Mg-doped p-type and Si-doped n-type barriers close to the QW were used to reduce the net internal electric field in the QW, thereby improving the electron–hole wavefunction overlap on the LEDs. LEDs with doped barriers show short lifetimes and low carrier densities in the active region compared to the reference LEDs. The recombination coefficients in the ABC model were estimated based on the carrier lifetime and quantum efficiency measurements. The improvement in the radiative coefficients in the LEDs with doped barriers coupled with the blueshift of the emission wavelengths indeed indicates an enhancement in wavefunction overlap and a reduction of quantum confined Stark effect as a result of the reduced internal electric field. However, doped barriers also introduce non-radiative recombination centers and thereby increase the Shockley–Read–Hall (SRH) coefficient, although the increment is less for LEDs with high indium composition QWs. As a result, at high indium composition (22%), LEDs with doped barriers outperform the reference LEDs even though the trend is reversed for LEDs with lower indium composition (13.5%). Despite the trade-off of higher SRH coefficients, doped barriers are shown to be effective in reducing the internal electric field and increasing the recombination coefficients.},
doi = {10.1063/5.0117318},
journal = {Applied Physics Letters},
number = 18,
volume = 121,
place = {United States},
year = {Tue Nov 01 00:00:00 EDT 2022},
month = {Tue Nov 01 00:00:00 EDT 2022}
}

Works referenced in this record:

Reduction of oscillator strength due to piezoelectric fields in G a N / A l x Ga 1 x N quantum wells
journal, April 1998


Effects of macroscopic polarization in III-V nitride multiple quantum wells
journal, September 1999

  • Fiorentini, Vincenzo; Bernardini, Fabio; Della Sala, Fabio
  • Physical Review B, Vol. 60, Issue 12
  • DOI: 10.1103/PhysRevB.60.8849

Direct measurement of hot-carrier generation in a semiconductor barrier heterostructure: Identification of the dominant mechanism for thermal droop
journal, September 2019

  • Myers, Daniel J.; Gelžinytė, Kristina; Alhassan, Abdullah I.
  • Physical Review B, Vol. 100, Issue 12
  • DOI: 10.1103/PhysRevB.100.125303

Evidence of trap-assisted Auger recombination in low radiative efficiency MBE-grown III-nitride LEDs
journal, November 2019

  • Espenlaub, Andrew C.; Myers, Daniel J.; Young, Erin C.
  • Journal of Applied Physics, Vol. 126, Issue 18
  • DOI: 10.1063/1.5096773

Many-Body Effects in Strongly Disordered III-Nitride Quantum Wells: Interplay Between Carrier Localization and Coulomb Interaction
journal, October 2019


All-optical measurements of carrier dynamics in bulk-GaN LEDs: Beyond the ABC approximation
journal, June 2017

  • David, Aurelien; Young, Nathan G.; Hurni, Christophe A.
  • Applied Physics Letters, Vol. 110, Issue 25
  • DOI: 10.1063/1.4986908

Differential carrier lifetime and transport effects in electrically injected III-nitride light-emitting diodes
journal, July 2017

  • Rashidi, A.; Nami, M.; Monavarian, M.
  • Journal of Applied Physics, Vol. 122, Issue 3
  • DOI: 10.1063/1.4994648

Field-assisted Shockley-Read-Hall recombinations in III-nitride quantum wells
journal, December 2017

  • David, Aurelien; Hurni, Christophe A.; Young, Nathan G.
  • Applied Physics Letters, Vol. 111, Issue 23
  • DOI: 10.1063/1.5003112

Reduction of efficiency droop in c-plane InGaN/GaN light-emitting diodes using a thick single quantum well with doped barriers
journal, November 2021

  • Chow, Y. C.; Lynsky, C.; Wu, F.
  • Applied Physics Letters, Vol. 119, Issue 22
  • DOI: 10.1063/5.0073741

Compensation between radiative and Auger recombinations in III-nitrides: The scaling law of separated-wavefunction recombinations
journal, November 2019

  • David, Aurelien; Young, Nathan G.; Lund, Cory
  • Applied Physics Letters, Vol. 115, Issue 19
  • DOI: 10.1063/1.5123743

Droop in InGaN light-emitting diodes: A differential carrier lifetime analysis
journal, March 2010

  • David, Aurélien; Grundmann, Michael J.
  • Applied Physics Letters, Vol. 96, Issue 10
  • DOI: 10.1063/1.3330870

Interplay of polarization fields and Auger recombination in the efficiency droop of nitride light-emitting diodes
journal, December 2012

  • Kioupakis, Emmanouil; Yan, Qimin; Van de Walle, Chris G.
  • Applied Physics Letters, Vol. 101, Issue 23
  • DOI: 10.1063/1.4769374

Polarization field screening in thick (0001) InGaN/GaN single quantum well light-emitting diodes
journal, February 2016

  • Young, N. G.; Farrell, R. M.; Oh, S.
  • Applied Physics Letters, Vol. 108, Issue 6
  • DOI: 10.1063/1.4941815

Luminescence spectra from InGaN multiquantum wells heavily doped with Si
journal, June 1998

  • Deguchi, T.; Shikanai, A.; Torii, K.
  • Applied Physics Letters, Vol. 72, Issue 25
  • DOI: 10.1063/1.121594

Towards quantification of the crucial impact of auger recombination for the efficiency droop in (AlInGa)N quantum well structures
journal, January 2016

  • Nirschl, Anna; Binder, Michael; Schmid, Marina
  • Optics Express, Vol. 24, Issue 3
  • DOI: 10.1364/OE.24.002971

Quantum Efficiency of III-Nitride Emitters: Evidence for Defect-Assisted Nonradiative Recombination and its Effect on the Green Gap
journal, March 2019


Origin of defect-related photoluminescence bands in doped and nominally undoped GaN
journal, February 1999


Influence of polarization fields on carrier lifetime and recombination rates in InGaN-based light-emitting diodes
journal, July 2010

  • David, Aurélien; Grundmann, Michael J.
  • Applied Physics Letters, Vol. 97, Issue 3
  • DOI: 10.1063/1.3462916

Contribution of deep-level defects to decreasing radiative efficiency of InGaN/GaN quantum wells with increasing emission wavelength
journal, March 2014

  • Armstrong, Andrew M.; Crawford, Mary H.; Koleske, Daniel D.
  • Applied Physics Express, Vol. 7, Issue 3
  • DOI: 10.7567/APEX.7.032101

Optical properties of InGaN quantum wells
journal, May 1999


Polarization field effects on the electron-hole recombination dynamics in In0.2Ga0.8N/In1−xGaxN multiple quantum wells
journal, November 1997

  • Buongiorno Nardelli, Marco; Rapcewicz, Krzysztof; Bernholc, J.
  • Applied Physics Letters, Vol. 71, Issue 21
  • DOI: 10.1063/1.120269

Review—The Physics of Recombinations in III-Nitride Emitters
journal, January 2020

  • David, Aurelien; Young, Nathan G.; Lund, Cory
  • ECS Journal of Solid State Science and Technology, Vol. 9, Issue 1
  • DOI: 10.1149/2.0372001JSS

Fully-screened polarization-induced electric fields in blue∕violet InGaN∕GaN light-emitting devices grown on bulk GaN
journal, July 2005

  • Franssen, G.; Suski, T.; Perlin, P.
  • Applied Physics Letters, Vol. 87, Issue 4
  • DOI: 10.1063/1.2000331