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Title: Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline

Abstract

A transmission X-ray microscope (TXM) has been designed and commissioned at the 18-ID Fullfield X-ray Imaging (FXI) beamline at the National Synchrotron Light Source-II (NSLS-II). This instrument operates in the 5-11 keV range, and, with the current set of optics, is capable of 30 nm spatial resolution imaging, with a field of view (FOV) of about 40 microns. For absorption contrast, the minimum exposure time for a single projection image is about 20 ms and an entire 3D tomography data set can be acquired in under one minute. The system enables tomographic reconstructions with sub-50 nm spatial resolution without the use of markers on the sample or corrections for rotation run-outs.

Authors:
 [1]; ORCiD logo [1]; ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [1]
+ Show Author Affiliations
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  2. Academia Sinica, Taipei (Taiwan)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1524554
Alternate Identifier(s):
OSTI ID: 1511070
Report Number(s):
BNL-211719-2019-JAAM
Journal ID: ISSN 0034-6748
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 90; Journal Issue: 5; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Coburn, David Scott, Nazaretski, Evgeny, Xu, Weihe, Ge, Mingyuan, Longo, Cindy, Xu, Huijuan, Gofron, Kazimierz, Yin, Zhijian, Chen, Huang Han, Hwu, Yeukuang, and Lee, Wah-Keat. Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline. United States: N. p., 2019. Web. doi:10.1063/1.5088124.
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Coburn, David Scott, Nazaretski, Evgeny, Xu, Weihe, Ge, Mingyuan, Longo, Cindy, Xu, Huijuan, Gofron, Kazimierz, Yin, Zhijian, Chen, Huang Han, Hwu, Yeukuang, & Lee, Wah-Keat. Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline. United States. https://doi.org/10.1063/1.5088124
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Coburn, David Scott, Nazaretski, Evgeny, Xu, Weihe, Ge, Mingyuan, Longo, Cindy, Xu, Huijuan, Gofron, Kazimierz, Yin, Zhijian, Chen, Huang Han, Hwu, Yeukuang, and Lee, Wah-Keat. Mon . "Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline". United States. https://doi.org/10.1063/1.5088124. https://www.osti.gov/servlets/purl/1524554.
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@article{osti_1524554,
title = {Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline},
author = {Coburn, David Scott and Nazaretski, Evgeny and Xu, Weihe and Ge, Mingyuan and Longo, Cindy and Xu, Huijuan and Gofron, Kazimierz and Yin, Zhijian and Chen, Huang Han and Hwu, Yeukuang and Lee, Wah-Keat},
abstractNote = {A transmission X-ray microscope (TXM) has been designed and commissioned at the 18-ID Fullfield X-ray Imaging (FXI) beamline at the National Synchrotron Light Source-II (NSLS-II). This instrument operates in the 5-11 keV range, and, with the current set of optics, is capable of 30 nm spatial resolution imaging, with a field of view (FOV) of about 40 microns. For absorption contrast, the minimum exposure time for a single projection image is about 20 ms and an entire 3D tomography data set can be acquired in under one minute. The system enables tomographic reconstructions with sub-50 nm spatial resolution without the use of markers on the sample or corrections for rotation run-outs.},
doi = {10.1063/1.5088124},
journal = {Review of Scientific Instruments},
number = 5,
volume = 90,
place = {United States},
year = {Mon May 06 00:00:00 EDT 2019},
month = {Mon May 06 00:00:00 EDT 2019}
}
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Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.5088124
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Cited by: 15 works
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Figures / Tables:

FIG. 1 FIG. 1: Schematic of a TXM. The condenser focusses the X-rays onto the sample. The zone plate (ZP) magnifies and images the sample onto a detector. A phase ring can be inserted at the back focal plane of the zone plate for Zernike phase-contrast. A Bertrand lens, located downstream ofmore » the phase ring, that is used to visualize the back focal plane of the objective zone plate during alignment of the phase ring is not shown.« less
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Works referenced in this record:

Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II
journal, October 2017

Oxygen Release Induced Chemomechanical Breakdown of Layered Cathode Materials
journal, April 2018

Full-field transmission x-ray microscopy at SSRL
journal, September 2009

Design and performance of a scanning ptychography microscope
journal, March 2014

  • Nazaretski, E.; Huang, X.; Yan, H.
  • Review of Scientific Instruments, Vol. 85, Issue 3
  • DOI: 10.1063/1.4868968

Hard X-ray Microscopy with sub 30 nm Spatial Resolution
conference, January 2007

  • Tang, Mau-Tsu; Song, Yen-Fang; Yin, Gung-Chian
  • SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation, AIP Conference Proceedings
  • DOI: 10.1063/1.2436296

Hard X-ray nanotomography beamline 7C XNI at PLS-II
journal, May 2014

Lifetime of the solar nebula constrained by meteorite paleomagnetism
journal, February 2017

One-minute nano-tomography using hard X-ray full-field transmission microscope
journal, August 2018

  • Ge, Mingyuan; Coburn, David Scott; Nazaretski, Evgeny
  • Applied Physics Letters, Vol. 113, Issue 8
  • DOI: 10.1063/1.5048378

Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution
journal, April 2012

  • Wang, Jun; Karen Chen, Yu-chen; Yuan, Qingxi
  • Applied Physics Letters, Vol. 100, Issue 14
  • DOI: 10.1063/1.3701579

A high-precision instrument for mapping of rotational errors in rotary stages
journal, October 2014

FXI: a full-field imaging beamline at NSLS-II
conference, September 2015

  • Lee, Wah-Keat; Reininger, Ruben; Loo, William
  • SPIE Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.2189914

Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope
journal, March 2013

  • Nazaretski, E.; Kim, Jungdae; Yan, H.
  • Review of Scientific Instruments, Vol. 84, Issue 3
  • DOI: 10.1063/1.4774387

Heterogeneous silicon mesostructures for lipid-supported bioelectric interfaces
journal, June 2016

  • Jiang, Yuanwen; Carvalho-de-Souza, João L.; Wong, Raymond C. S.
  • Nature Materials, Vol. 15, Issue 9
  • DOI: 10.1038/nmat4673
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    • Angewandte Chemie International Edition, Vol. 58, Issue 51
    • DOI: 10.1002/anie.201910993

    Stability investigation of a cryo soft x-ray microscope by fiber interferometry
    journal, February 2020

    • Kördel, M.; Arsana, K. G. Y.; Hertz, H. M.
    • Review of Scientific Instruments, Vol. 91, Issue 2
    • DOI: 10.1063/1.5138369

    Distributed optimization for nonrigid nano-tomography
    text, January 2020

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      Figures / Tables found in this record:

      FIG. 1 (p. 4)figure
      FIG. 2 (p. 5)figure
      FIG. 3 (p. 6)figure
      Table I (p. 6)table
      FIG. 4 (p. 9)figure
      FIG. 5 (p. 10)figure
      FIG. 6 (p. 10)figure
      FIG. 8 (p. 13)figure
      FIG. 9 (p. 15)figure
      FIG. 10 (p. 16)figure
      FIG. 11 (p. 18)figure
      FIG. 12 (p. 21)figure
      FIG. 13 (p. 21)figure
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