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Title: One-minute nano-tomography using hard X-ray full-field transmission microscope

Abstract

Full field transmission X-ray microscope (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. However, to date, the typical acquisition time with the hard X-ray TXM at a synchrotron facility is > 10 minutes for a 3D nano-tomography data set with sub-50 nm spatial resolution. This is a significant limit on the types of 3D dynamics that can be investigated using this technique. Here, we present a demonstration of one-minute nano-tomography with sub-50 nm spatial resolution. This achievement is made possible with an in-house designed and commissioned TXM instrument at the Full-field X-ray Imaging (FXI) beamline at the National Synchrotron Light Source-II (NSLS-II) at Brookhaven National Laboratory. This capability represents an order of magnitude decrease in the time required for studying sample dynamics with 10s of nm spatial resolution.

Authors:
 [1];  [1]; ORCiD logo [1]; ORCiD logo [1];  [1];  [1];  [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1469787
Alternate Identifier(s):
OSTI ID: 1465900
Report Number(s):
BNL-209031-2018-JAAM
Journal ID: ISSN 0003-6951
Grant/Contract Number:  
SC0012704; AC02-98CH10886
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 113; Journal Issue: 8; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Ge, Mingyuan, Coburn, David Scott, Nazaretski, Evgeny, Xu, Weihe, Gofron, Kazimierz, Xu, Huijuan, Yin, Zhijian, and Lee, Wah-Keat. One-minute nano-tomography using hard X-ray full-field transmission microscope. United States: N. p., 2018. Web. doi:10.1063/1.5048378.
Ge, Mingyuan, Coburn, David Scott, Nazaretski, Evgeny, Xu, Weihe, Gofron, Kazimierz, Xu, Huijuan, Yin, Zhijian, & Lee, Wah-Keat. One-minute nano-tomography using hard X-ray full-field transmission microscope. United States. doi:10.1063/1.5048378.
Ge, Mingyuan, Coburn, David Scott, Nazaretski, Evgeny, Xu, Weihe, Gofron, Kazimierz, Xu, Huijuan, Yin, Zhijian, and Lee, Wah-Keat. Mon . "One-minute nano-tomography using hard X-ray full-field transmission microscope". United States. doi:10.1063/1.5048378. https://www.osti.gov/servlets/purl/1469787.
@article{osti_1469787,
title = {One-minute nano-tomography using hard X-ray full-field transmission microscope},
author = {Ge, Mingyuan and Coburn, David Scott and Nazaretski, Evgeny and Xu, Weihe and Gofron, Kazimierz and Xu, Huijuan and Yin, Zhijian and Lee, Wah-Keat},
abstractNote = {Full field transmission X-ray microscope (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. However, to date, the typical acquisition time with the hard X-ray TXM at a synchrotron facility is > 10 minutes for a 3D nano-tomography data set with sub-50 nm spatial resolution. This is a significant limit on the types of 3D dynamics that can be investigated using this technique. Here, we present a demonstration of one-minute nano-tomography with sub-50 nm spatial resolution. This achievement is made possible with an in-house designed and commissioned TXM instrument at the Full-field X-ray Imaging (FXI) beamline at the National Synchrotron Light Source-II (NSLS-II) at Brookhaven National Laboratory. This capability represents an order of magnitude decrease in the time required for studying sample dynamics with 10s of nm spatial resolution.},
doi = {10.1063/1.5048378},
journal = {Applied Physics Letters},
number = 8,
volume = 113,
place = {United States},
year = {2018},
month = {8}
}

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