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Title: XPS Studies of LSCF Interfaces after Cell Testing

Abstract

The motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing. The literature uses XPS to study various cathode materials but has devoted little to the understanding of various cathode interfaces especially after testing. In this work, an SOFC button cell is first tested, and then, the LSCF cathode, barrier layer, and electrolyte are sputtered away to study the behavior of different interfaces. This work has shown that some elements have moved into other layers of the SOFC cell. It is argued that the migration of the elements is partly due to a redeposition mechanism after atoms are sputtered away, while the rest is due to interdiffusion between the SDC and YSZ layers. However, additional work is needed to better understand the mechanism by which atoms move around at different interfaces. In conclusion, the cell electrochemical performance is also discussed in some details but is not the focus.

Authors:
ORCiD logo [1];  [1];  [1]
  1. Kettering Univ., Flint, MI (United States)
Publication Date:
Research Org.:
National Energy Technology Laboratory, Pittsburgh, PA, and Morgantown, WV (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1499024
Grant/Contract Number:  
FE0026168
Resource Type:
Accepted Manuscript
Journal Name:
Advances in Materials Science and Engineering
Additional Journal Information:
Journal Volume: 2018; Journal ID: ISSN 1687-8434
Publisher:
Hindawi
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

DiGiuseppe, Gianfranco, Boddapati, Venkatesh, and Mothikhana, Hiten. XPS Studies of LSCF Interfaces after Cell Testing. United States: N. p., 2018. Web. doi:10.1155/2018/7561561.
DiGiuseppe, Gianfranco, Boddapati, Venkatesh, & Mothikhana, Hiten. XPS Studies of LSCF Interfaces after Cell Testing. United States. doi:10.1155/2018/7561561.
DiGiuseppe, Gianfranco, Boddapati, Venkatesh, and Mothikhana, Hiten. Sun . "XPS Studies of LSCF Interfaces after Cell Testing". United States. doi:10.1155/2018/7561561. https://www.osti.gov/servlets/purl/1499024.
@article{osti_1499024,
title = {XPS Studies of LSCF Interfaces after Cell Testing},
author = {DiGiuseppe, Gianfranco and Boddapati, Venkatesh and Mothikhana, Hiten},
abstractNote = {The motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing. The literature uses XPS to study various cathode materials but has devoted little to the understanding of various cathode interfaces especially after testing. In this work, an SOFC button cell is first tested, and then, the LSCF cathode, barrier layer, and electrolyte are sputtered away to study the behavior of different interfaces. This work has shown that some elements have moved into other layers of the SOFC cell. It is argued that the migration of the elements is partly due to a redeposition mechanism after atoms are sputtered away, while the rest is due to interdiffusion between the SDC and YSZ layers. However, additional work is needed to better understand the mechanism by which atoms move around at different interfaces. In conclusion, the cell electrochemical performance is also discussed in some details but is not the focus.},
doi = {10.1155/2018/7561561},
journal = {Advances in Materials Science and Engineering},
number = ,
volume = 2018,
place = {United States},
year = {2018},
month = {2}
}

Journal Article:
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