Study of silicon photomultiplier performance in external electric fields

Sun, X. L.; Tolba, T.; Cao, G. F.; Lv, P.; Wen, L. J.; Odian, A.; Vachon, F.; Alamre, A.; Albert, J. B.; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J. P.; Brown, E.; Brunner, T.; Burenkov, A.; Cao, L.; Cen, W. R.; Chambers, C.; Charlebois, S. A.; Chiu, M.; Cleveland, B.; Coon, M.; Côté, M.; Craycraft, A.; Cree, W.; Dalmasson, J.; Daniels, T.; Darroch, L.; Daugherty, S. J.; Daughhetee, J.; Delaquis, S.; Mesrobian-Kabakian, A. Der; DeVoe, R.; Dilling, J.; Ding, Y. Y.; Dolinski, M. J.; Dragone, A.; Echevers, J.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Feyzbakhsh, S.; Fierlinger, P.; Fontaine, R.; Fudenberg, D.; Gallina, G.; Giacomini, G.; Gornea, R.; Gratta, G.; Hansen, E. V.; Harris, D.; Heffner, M.; Hoppe, E. W.; Hößl, J.; House, A.; Hufschmidt, P.; Hughes, M.; Ito, Y.; Iverson, A.; Jamil, A.; Jessiman, C.; Jewell, M. J.; Jiang, X. S.; Karelin, A.; Kaufman, L. J.; Kodroff, D.; Koffas, T.; Kravitz, S.; Krücken, R.; Kuchenkov, A.; Kumar, K. S.; Lan, Y.; Larson, A.; Leonard, D. S.; Li, G.; Li, S.; Li, Z.; Licciardi, C.; Lin, Y. H.; MacLellan, R.; Michel, T.; Moe, M.; Mong, B.; Moore, D. C.; Murray, K.; Newby, R. J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Oriunno, M.; Orrell, J. L.; Ortega, G. S.; Ostrovskiy, I.; Overman, C. T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J. -F.; Qiu, D.; Radeka, V.; Raguzin, E.; Rao, T.; Rescia, S.; Retière, F.; Robinson, A.; Rossignol, T.; Rowson, P. C.; Roy, N.; Saldanha, R.; Sangiorgio, S.; Schmidt, S.; Schneider, J.; Sinclair, D.; VIII, K. Skarpaas; Soma, A. K.; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Tarka, M.; Todd, J.; Totev, T. I.; Tsang, R.; Tsang, T.; Veenstra, B.; Veeraraghavan, V.; Visser, G.; Vuilleumier, J. -L.; Wagenpfeil, M.; Wang, Q.; Watkins, J.; Weber, M.; Wei, W.; Wichoski, U.; Wrede, G.; Wu, S. X.; Wu, W. H.; Xia, Q.; Yang, L.; Yen, Y. -R.; Zeldovich, O.; Zhao, J.; Zhou, Y.; Ziegler, T.

doi:10.1088/1748-0221/13/09/t09006

Title: Study of silicon photomultiplier performance in external electric fields

Authors:: Sun, X. L.; Tolba, T.; Cao, G. F.; Lv, P.; Wen, L. J.; Odian, A.; Vachon, F.; Alamre, A.; Albert, J. B.; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J. P.; Brown, E.; Brunner, T. more »« less

Publication Date:: Mon Sep 17 00:00:00 EDT 2018

Research Org.:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Org.:: USDOE

Contributing Org.:: nEXO collaboration

OSTI Identifier:: 1475419

Alternate Identifier(s):: OSTI ID: 1525722

Report Number(s):: LLNL-JRNL-759457
Journal ID: ISSN 1748-0221

Grant/Contract Number:: AC02-76SF00515; AC52-07NA27344

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Instrumentation

Additional Journal Information:: Journal Volume: 13; Journal Issue: 09; Journal ID: ISSN 1748-0221

Publisher:: Institute of Physics (IOP)

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; Cryogenic detectors; Photon detectors for UV; visible and IR photons (solid-state) (PIN diodes; APDs; Si-PMTs; G-APDs; CCDs; EBCCDs; EMCCDs etc); Double-beta decay detectors; Noble liquid detectors (scintillation, ionization, double-phase)

Citation Formats


                    Sun, X. L., Tolba, T., Cao, G. F., Lv, P., Wen, L. J., Odian, A., Vachon, F., Alamre, A., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, L., Cen, W. R., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Côté, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, DeVoe, R., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Hansen, E. V., Harris, D., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jessiman, C., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Moe, M., Mong, B., Moore, D. C., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., VIII, K. Skarpaas, Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Xia, Q., Yang, L., Yen, Y. -R., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. Study of silicon photomultiplier performance in external electric fields.  United States: N. p., 2018. 
Web.  doi:10.1088/1748-0221/13/09/t09006.

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                    Sun, X. L., Tolba, T., Cao, G. F., Lv, P., Wen, L. J., Odian, A., Vachon, F., Alamre, A., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, L., Cen, W. R., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Côté, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, DeVoe, R., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Hansen, E. V., Harris, D., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jessiman, C., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Moe, M., Mong, B., Moore, D. C., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., VIII, K. Skarpaas, Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Xia, Q., Yang, L., Yen, Y. -R., Zeldovich, O., Zhao, J., Zhou, Y., & Ziegler, T. Study of silicon photomultiplier performance in external electric fields.  United States.  https://doi.org/10.1088/1748-0221/13/09/t09006

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                    Sun, X. L., Tolba, T., Cao, G. F., Lv, P., Wen, L. J., Odian, A., Vachon, F., Alamre, A., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, L., Cen, W. R., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Côté, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, DeVoe, R., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Hansen, E. V., Harris, D., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jessiman, C., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leonard, D. S., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y. H., MacLellan, R., Michel, T., Moe, M., Mong, B., Moore, D. C., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J. L., Ortega, G. S., Ostrovskiy, I., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J. -F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., VIII, K. Skarpaas, Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Tarka, M., Todd, J., Totev, T. I., Tsang, R., Tsang, T., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J. -L., Wagenpfeil, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Xia, Q., Yang, L., Yen, Y. -R., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. Mon .  
"Study of silicon photomultiplier performance in external electric fields".  United States.  https://doi.org/10.1088/1748-0221/13/09/t09006.  https://www.osti.gov/servlets/purl/1475419.

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@article{osti_1475419,

  title        = {Study of silicon photomultiplier performance in external electric fields},

  author       = {Sun, X. L. and Tolba, T. and Cao, G. F. and Lv, P. and Wen, L. J. and Odian, A. and Vachon, F. and Alamre, A. and Albert, J. B. and Anton, G. and Arnquist, I. J. and Badhrees, I. and Barbeau, P. S. and Beck, D. and Belov, V. and Bhatta, T. and Bourque, F. and Brodsky, J. P. and Brown, E. and Brunner, T. and Burenkov, A. and Cao, L. and Cen, W. R. and Chambers, C. and Charlebois, S. A. and Chiu, M. and Cleveland, B. and Coon, M. and Côté, M. and Craycraft, A. and Cree, W. and Dalmasson, J. and Daniels, T. and Darroch, L. and Daugherty, S. J. and Daughhetee, J. and Delaquis, S. and Mesrobian-Kabakian, A. Der and DeVoe, R. and Dilling, J. and Ding, Y. Y. and Dolinski, M. J. and Dragone, A. and Echevers, J. and Fabris, L. and Fairbank, D. and Fairbank, W. and Farine, J. and Feyzbakhsh, S. and Fierlinger, P. and Fontaine, R. and Fudenberg, D. and Gallina, G. and Giacomini, G. and Gornea, R. and Gratta, G. and Hansen, E. V. and Harris, D. and Heffner, M. and Hoppe, E. W. and Hößl, J. and House, A. and Hufschmidt, P. and Hughes, M. and Ito, Y. and Iverson, A. and Jamil, A. and Jessiman, C. and Jewell, M. J. and Jiang, X. S. and Karelin, A. and Kaufman, L. J. and Kodroff, D. and Koffas, T. and Kravitz, S. and Krücken, R. and Kuchenkov, A. and Kumar, K. S. and Lan, Y. and Larson, A. and Leonard, D. S. and Li, G. and Li, S. and Li, Z. and Licciardi, C. and Lin, Y. H. and MacLellan, R. and Michel, T. and Moe, M. and Mong, B. and Moore, D. C. and Murray, K. and Newby, R. J. and Ning, Z. and Njoya, O. and Nolet, F. and Nusair, O. and Odgers, K. and Oriunno, M. and Orrell, J. L. and Ortega, G. S. and Ostrovskiy, I. and Overman, C. T. and Parent, S. and Piepke, A. and Pocar, A. and Pratte, J. -F. and Qiu, D. and Radeka, V. and Raguzin, E. and Rao, T. and Rescia, S. and Retière, F. and Robinson, A. and Rossignol, T. and Rowson, P. C. and Roy, N. and Saldanha, R. and Sangiorgio, S. and Schmidt, S. and Schneider, J. and Sinclair, D. and VIII, K. Skarpaas and Soma, A. K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Tarka, M. and Todd, J. and Totev, T. I. and Tsang, R. and Tsang, T. and Veenstra, B. and Veeraraghavan, V. and Visser, G. and Vuilleumier, J. -L. and Wagenpfeil, M. and Wang, Q. and Watkins, J. and Weber, M. and Wei, W. and Wichoski, U. and Wrede, G. and Wu, S. X. and Wu, W. H. and Xia, Q. and Yang, L. and Yen, Y. -R. and Zeldovich, O. and Zhao, J. and Zhou, Y. and Ziegler, T.},

  abstractNote = {},

  doi          = {10.1088/1748-0221/13/09/t09006},

  journal      = {Journal of Instrumentation},

  number       = 09,

  volume       = 13,

  place        = {United States},

  year         = {Mon Sep 17 00:00:00 EDT 2018},

  month        = {Mon Sep 17 00:00:00 EDT 2018}

}

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https://doi.org/10.1088/1748-0221/13/09/t09006

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Cited by: 4 works

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Figure 1: Schematic diagram of the cryogenic test station operated with liquefied CF₄ in these measurements.

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Works referenced in this record:

Limited Geiger-mode microcell silicon photodiode: new results
journal, March 2000

Bondarenko, G.; Buzhan, P.; Dolgoshein, B.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 442, Issue 1-3
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Characterization of Silicon Photomultipliers for nEXO
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Sensitivity and discovery potential of the proposed nEXO experiment to neutrinoless double- $β$ decay
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Albert, J. B.; Anton, G.; Arnquist, I. J.
Physical Review C, Vol. 97, Issue 6
DOI: 10.1103/PhysRevC.97.065503

Silicon photomultiplier performance tests in magnetic resonance pulsed fields
conference, October 2007

Hawkes, Rob; Lucas, Alfgun; Stevick, Joseph
2007 IEEE Nuclear Science Symposium Conference Record
DOI: 10.1109/NSSMIC.2007.4436860

Physics of Semiconductor Devices
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Sze, S. M.; Ng, Kwok K.
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Relative permittivities of 10 organic liquids as functions of temperature
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Dielectric Constants of Liquefied Noble Gases and Methane
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Characterization of new FBK SiPM technology for visible light detection
journal, March 2013

Serra, N.; Ferri, A.; Gola, A.
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ROOT — An object oriented data analysis framework
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 389, Issue 1-2
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Title: Study of silicon photomultiplier performance in external electric fields

Citation Formats

Figures / Tables:

Limited Geiger-mode microcell silicon photodiode: new results journal, March 2000

Characterization of Silicon Photomultipliers for nEXO journal, August 2015

Sensitivity and discovery potential of the proposed nEXO experiment to neutrinoless double- β decay journal, June 2018

Silicon photomultiplier performance tests in magnetic resonance pulsed fields conference, October 2007

Physics of Semiconductor Devices book, January 2007

Relative permittivities of 10 organic liquids as functions of temperature journal, April 1993

Dielectric Constants of Liquefied Noble Gases and Methane journal, January 1964

Characterization of new FBK SiPM technology for visible light detection journal, March 2013

ROOT — An object oriented data analysis framework journal, April 1997

Limited Geiger-mode microcell silicon photodiode: new results
journal, March 2000

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journal, August 2015

Sensitivity and discovery potential of the proposed nEXO experiment to neutrinoless double- $β$ decay
journal, June 2018

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conference, October 2007

Physics of Semiconductor Devices
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journal, April 1993

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journal, January 1964

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ROOT — An object oriented data analysis framework
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