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Title: Extracting interface locations in multilayer polymer waveguide films using scanning angle Raman spectroscopy

Abstract

There is an increasing demand for nondestructive in situ techniques that measure chemical content, total thickness, and interface locations for multilayer polymer films, and SA Raman spectroscopy in combination with appropriate data models can provide this information. A scanning angle (SA) Raman spectroscopy method was developed to measure the chemical composition of multilayer polymer waveguide films and to extract the location of buried interfaces between polymer layers with 7–80-nm axial spatial resolution. The SA Raman method measures Raman spectra as the incident angle of light upon a prism-coupled thin film is scanned. Six multilayer films consisting of poly(methyl methacrylate)/polystyrene or poly(methyl methacrylate)/polystyrene/poly(methyl methacrylate) were prepared with total thicknesses ranging from 330-1260 nm. The interface locations were varied by altering the individual layer thicknesses between 140-680 nm. The Raman amplitude ratio of the 1605 cm -1 peak for PS and 812 cm -1 peak for PMMA was used in calculations of the electric field intensity within the polymer layers to model the SA Raman data and extract the total thickness and interface locations. There is an average 8% and 7% difference in the measured thickness between the SA Raman and profilometry measurements for bilayer and trilayer films, respectively.

Authors:
 [1]; ORCiD logo [1]
  1. Ames Lab., Ames, IA (United States)
Publication Date:
Research Org.:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1413139
Report Number(s):
IS-J-9334
Journal ID: ISSN 0377-0486; TRN: US1800415
Grant/Contract Number:  
AC02-07CH11358
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Raman Spectroscopy
Additional Journal Information:
Journal Volume: 49; Journal Issue: 2; Journal ID: ISSN 0377-0486
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Vibrational spectroscopy; Thin film analysis; Polymer polymer interface; Bilayer and trilayer polymer films

Citation Formats

Bobbitt, Jonathan M., and Smith, Emily A. Extracting interface locations in multilayer polymer waveguide films using scanning angle Raman spectroscopy. United States: N. p., 2017. Web. doi:10.1002/jrs.5275.
Bobbitt, Jonathan M., & Smith, Emily A. Extracting interface locations in multilayer polymer waveguide films using scanning angle Raman spectroscopy. United States. doi:10.1002/jrs.5275.
Bobbitt, Jonathan M., and Smith, Emily A. Thu . "Extracting interface locations in multilayer polymer waveguide films using scanning angle Raman spectroscopy". United States. doi:10.1002/jrs.5275. https://www.osti.gov/servlets/purl/1413139.
@article{osti_1413139,
title = {Extracting interface locations in multilayer polymer waveguide films using scanning angle Raman spectroscopy},
author = {Bobbitt, Jonathan M. and Smith, Emily A.},
abstractNote = {There is an increasing demand for nondestructive in situ techniques that measure chemical content, total thickness, and interface locations for multilayer polymer films, and SA Raman spectroscopy in combination with appropriate data models can provide this information. A scanning angle (SA) Raman spectroscopy method was developed to measure the chemical composition of multilayer polymer waveguide films and to extract the location of buried interfaces between polymer layers with 7–80-nm axial spatial resolution. The SA Raman method measures Raman spectra as the incident angle of light upon a prism-coupled thin film is scanned. Six multilayer films consisting of poly(methyl methacrylate)/polystyrene or poly(methyl methacrylate)/polystyrene/poly(methyl methacrylate) were prepared with total thicknesses ranging from 330-1260 nm. The interface locations were varied by altering the individual layer thicknesses between 140-680 nm. The Raman amplitude ratio of the 1605 cm-1 peak for PS and 812 cm-1 peak for PMMA was used in calculations of the electric field intensity within the polymer layers to model the SA Raman data and extract the total thickness and interface locations. There is an average 8% and 7% difference in the measured thickness between the SA Raman and profilometry measurements for bilayer and trilayer films, respectively.},
doi = {10.1002/jrs.5275},
journal = {Journal of Raman Spectroscopy},
number = 2,
volume = 49,
place = {United States},
year = {2017},
month = {11}
}

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