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Title: Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision

Abstract

In this study, near-infrared scanning angle (SA) Raman spectroscopy was utilized to determine the interface location in bilayer films (a stack of two polymer layers) of polystyrene (PS) and polycarbonate (PC). Finite-difference-time-domain (FDTD) calculations of the sum square electric field (SSEF) for films with total bilayer thicknesses of 1200–3600 nm were used to construct models for simultaneously measuring the film thickness and the location of the buried interface between the PS and PC layers. Samples with total thicknesses of 1320, 1890, 2300, and 2750 nm and varying PS/PC interface locations were analyzed using SA Raman spectroscopy. Comparing SA Raman spectroscopy and optical profilometry measurements, the average percent difference in the total bilayer thickness was 2.0% for films less than ~2300 nm thick. The average percent difference in the thickness of the PS layer, which reflects the interface location, was 2.5% when the PS layer was less than ~1800 nm. SA Raman spectroscopy has been shown to be a viable, non-destructive method capable of determining the total bilayer thickness and buried interface location for bilayer samples consisting of thin polymer films with comparable indices of refraction.

Authors:
 [1];  [1];  [2];  [1]
  1. Ames Lab., Ames, IA (United States); Iowa State Univ., Ames, IA (United States)
  2. Ames Lab. (AMES), Ames, IA (United States)
Publication Date:
Research Org.:
Ames Lab., Ames, IA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1233222
Report Number(s):
IS-J-8513
Journal ID: ISSN 0003-2654; ANALAO
Grant/Contract Number:  
AC02-07CH11358
Resource Type:
Accepted Manuscript
Journal Name:
Analyst
Additional Journal Information:
Journal Volume: 140; Journal Issue: 6; Journal ID: ISSN 0003-2654
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Damin, Craig A., Nguyen, Vy H. T., Niyibizi, Auguste S., and Smith, Emily A. Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision. United States: N. p., 2015. Web. doi:10.1039/C4AN02240H.
Damin, Craig A., Nguyen, Vy H. T., Niyibizi, Auguste S., & Smith, Emily A. Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision. United States. doi:10.1039/C4AN02240H.
Damin, Craig A., Nguyen, Vy H. T., Niyibizi, Auguste S., and Smith, Emily A. Wed . "Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision". United States. doi:10.1039/C4AN02240H. https://www.osti.gov/servlets/purl/1233222.
@article{osti_1233222,
title = {Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision},
author = {Damin, Craig A. and Nguyen, Vy H. T. and Niyibizi, Auguste S. and Smith, Emily A.},
abstractNote = {In this study, near-infrared scanning angle (SA) Raman spectroscopy was utilized to determine the interface location in bilayer films (a stack of two polymer layers) of polystyrene (PS) and polycarbonate (PC). Finite-difference-time-domain (FDTD) calculations of the sum square electric field (SSEF) for films with total bilayer thicknesses of 1200–3600 nm were used to construct models for simultaneously measuring the film thickness and the location of the buried interface between the PS and PC layers. Samples with total thicknesses of 1320, 1890, 2300, and 2750 nm and varying PS/PC interface locations were analyzed using SA Raman spectroscopy. Comparing SA Raman spectroscopy and optical profilometry measurements, the average percent difference in the total bilayer thickness was 2.0% for films less than ~2300 nm thick. The average percent difference in the thickness of the PS layer, which reflects the interface location, was 2.5% when the PS layer was less than ~1800 nm. SA Raman spectroscopy has been shown to be a viable, non-destructive method capable of determining the total bilayer thickness and buried interface location for bilayer samples consisting of thin polymer films with comparable indices of refraction.},
doi = {10.1039/C4AN02240H},
journal = {Analyst},
number = 6,
volume = 140,
place = {United States},
year = {2015},
month = {2}
}

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