Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness
Abstract
A scanning angle (SA) Raman spectroscopy method was developed to simultaneously measure the chemical composition and thickness of waveguide mixed polymer films with varying fractional compositions. In order to test the method, six films of polystyrene-block-poly(methyl methacrylate), some mixed with poly(methyl methacrylate) homopolymer (PS-b-PMMA:PMMA), and two films of poly(2-vinylnapthalene)-block-poly(methyl methacrylate) (P2VN-b-PMMA) were prepared. The film thickness ranged from 495 to 971 nm. The chemical composition and thickness of PS-b-PMMA:PMMA films was varied by the addition of the PMMA homopolymer and annealing the films in toluene. SA Raman peak amplitude ratios (1001 cm-1 for PS, 812 cm-1 for PMMA, and 1388 cm-1 for P2VN) were used to calculate the refractive index of the polymer film, an input parameter in calculations of the sum square electric field (SSEF). The film thickness was determined by SSEF models of the experimental Raman amplitudes versus the incident angle of light. The average film thickness determined by the developed SA Raman spectroscopy method was within 5% of the value determined by optical profilometry. In conclusion, SA Raman spectroscopy will be useful for in situ label-free analyses of mixed polymer waveguide films.
- Authors:
-
- Ames Lab. and Iowa State Univ., Ames, IA (United States). Dept. of Chemistry
- Publication Date:
- Research Org.:
- Ames Lab., Ames, IA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1342928
- Alternate Identifier(s):
- OSTI ID: 1396482
- Report Number(s):
- IS-J-9033
Journal ID: ISSN 0032-3861; PII: S0032386116309788
- Grant/Contract Number:
- AC02-07CH11358
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Polymer
- Additional Journal Information:
- Journal Volume: 107; Journal Issue: C; Journal ID: ISSN 0032-3861
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; Vibrational spectroscopy; Thin polymer films; Mixed polymer fractional composition
Citation Formats
Bobbitt, Jonathan M., Mendivelso-Pérez, Deyny, and Smith, Emily A. Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness. United States: N. p., 2016.
Web. doi:10.1016/j.polymer.2016.10.063.
Bobbitt, Jonathan M., Mendivelso-Pérez, Deyny, & Smith, Emily A. Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness. United States. https://doi.org/10.1016/j.polymer.2016.10.063
Bobbitt, Jonathan M., Mendivelso-Pérez, Deyny, and Smith, Emily A. Thu .
"Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness". United States. https://doi.org/10.1016/j.polymer.2016.10.063. https://www.osti.gov/servlets/purl/1342928.
@article{osti_1342928,
title = {Scanning angle Raman spectroscopy: A nondestructive method for simultaneously determining mixed polymer fractional composition and film thickness},
author = {Bobbitt, Jonathan M. and Mendivelso-Pérez, Deyny and Smith, Emily A.},
abstractNote = {A scanning angle (SA) Raman spectroscopy method was developed to simultaneously measure the chemical composition and thickness of waveguide mixed polymer films with varying fractional compositions. In order to test the method, six films of polystyrene-block-poly(methyl methacrylate), some mixed with poly(methyl methacrylate) homopolymer (PS-b-PMMA:PMMA), and two films of poly(2-vinylnapthalene)-block-poly(methyl methacrylate) (P2VN-b-PMMA) were prepared. The film thickness ranged from 495 to 971 nm. The chemical composition and thickness of PS-b-PMMA:PMMA films was varied by the addition of the PMMA homopolymer and annealing the films in toluene. SA Raman peak amplitude ratios (1001 cm-1 for PS, 812 cm-1 for PMMA, and 1388 cm-1 for P2VN) were used to calculate the refractive index of the polymer film, an input parameter in calculations of the sum square electric field (SSEF). The film thickness was determined by SSEF models of the experimental Raman amplitudes versus the incident angle of light. The average film thickness determined by the developed SA Raman spectroscopy method was within 5% of the value determined by optical profilometry. In conclusion, SA Raman spectroscopy will be useful for in situ label-free analyses of mixed polymer waveguide films.},
doi = {10.1016/j.polymer.2016.10.063},
journal = {Polymer},
number = C,
volume = 107,
place = {United States},
year = {Thu Nov 03 00:00:00 EDT 2016},
month = {Thu Nov 03 00:00:00 EDT 2016}
}
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