Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes

Varenyk, O. V.; Silibin, M. V.; Kiselev, Dmitri A.; Eliseev, E. A.; Kalinin, Sergei V.; Morozovska, A. N.

doi:10.1063/1.4927815

Title: Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes

Journal Article · Wed Aug 19 04:00:00 UTC 2015 · Journal of Applied Physics

DOI: https://doi.org/10.1063/1.4927815 · OSTI ID:1337498

Varenyk, O. V. ^[1]; Silibin, M. V. ^[2]; Kiselev, Dmitri A. ^[3]; Eliseev, E. A. ^[4];

^[5]; Morozovska, A. N. ^[1]

National Academy of Sciences of Ukraine (Ukraine)
National Research Univ. of Electronic Technology "MIET", Moscow (Russia)
National Univ. of Science and Technology "MISiS", Moscow (Russia)
NAS of Ukraine (Ukraine)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

The frequency dependent Electrochemical Strain Microscopy (ESM) response of mixed ionic-electronic conductors is analyzed within the framework of Fermi-Dirac statistics and the Vegard law, accounting for steric effects from mobile donors. The emergence of dynamic charge waves and nonlinear deformation of the surface in response to bias applied to the tip-surface junction is numerically explored. The 2D maps of the strain and concentration distributions across the mixed ionic-electronic conductor and bias-induced surface displacements are calculated. Furthermore, the obtained numerical results can be applied to quantify the ESM response of Li-based solid electrolytes, materials with resistive switching, and electroactive ferroelectric polymers, which are of potential interest for flexible and high-density non-volatile memory devices.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1337498

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 7 Vol. 118; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Determination of ferroelectric contributions to electromechanical response by frequency dependent piezoresponse force microscopy Seol, Daehee; Park, Seongjae; Varenyk, Olexandr V. Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep30579	journal	July 2016
Photothermoelastic contrast in nanoscale infrared spectroscopy Morozovska, Anna N.; Eliseev, Eugene A.; Borodinov, Nikolay Applied Physics Letters, Vol. 112, Issue 3 https://doi.org/10.1063/1.4985584	journal	January 2018

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