Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes

Varenyk, O. V.; Silibin, M. V.; Kiselev, Dmitri A.; Eliseev, E. A.; Kalinin, Sergei V.; Morozovska, A. N.

doi:10.1063/1.4927815

Title: Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes

Abstract

The frequency dependent Electrochemical Strain Microscopy (ESM) response of mixed ionic-electronic conductors is analyzed within the framework of Fermi-Dirac statistics and the Vegard law, accounting for steric effects from mobile donors. The emergence of dynamic charge waves and nonlinear deformation of the surface in response to bias applied to the tip-surface junction is numerically explored. The 2D maps of the strain and concentration distributions across the mixed ionic-electronic conductor and bias-induced surface displacements are calculated. Furthermore, the obtained numerical results can be applied to quantify the ESM response of Li-based solid electrolytes, materials with resistive switching, and electroactive ferroelectric polymers, which are of potential interest for flexible and high-density non-volatile memory devices.

Authors:

Varenyk, O. V. ^[1]; Silibin, M. V. ^[2]; Kiselev, Dmitri A. ^[3]; Eliseev, E. A. ^[4];

^[5]; Morozovska, A. N. ^[1]

National Academy of Sciences of Ukraine (Ukraine)
National Research Univ. of Electronic Technology "MIET", Moscow (Russia)
National Univ. of Science and Technology "MISiS", Moscow (Russia)
NAS of Ukraine (Ukraine)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Publication Date:: Wed Aug 19 00:00:00 EDT 2015

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1337498

Grant/Contract Number:: AC05-00OR22725

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Applied Physics

Additional Journal Information:: Journal Volume: 118; Journal Issue: 7; Journal ID: ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

Subject:: 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats


                    Varenyk, O. V., Silibin, M. V., Kiselev, Dmitri A., Eliseev, E. A., Kalinin, Sergei V., and Morozovska, A. N. Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes.  United States: N. p., 2015. 
Web.  doi:10.1063/1.4927815.

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                    Varenyk, O. V., Silibin, M. V., Kiselev, Dmitri A., Eliseev, E. A., Kalinin, Sergei V., & Morozovska, A. N. Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes.  United States.  https://doi.org/10.1063/1.4927815

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                    Varenyk, O. V., Silibin, M. V., Kiselev, Dmitri A., Eliseev, E. A., Kalinin, Sergei V., and Morozovska, A. N. Wed .  
"Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes".  United States.  https://doi.org/10.1063/1.4927815.  https://www.osti.gov/servlets/purl/1337498.

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@article{osti_1337498,

  title        = {Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes},

  author       = {Varenyk, O. V. and Silibin, M. V. and Kiselev, Dmitri A. and Eliseev, E. A. and Kalinin, Sergei V. and Morozovska, A. N.},

  abstractNote = {The frequency dependent Electrochemical Strain Microscopy (ESM) response of mixed ionic-electronic conductors is analyzed within the framework of Fermi-Dirac statistics and the Vegard law, accounting for steric effects from mobile donors. The emergence of dynamic charge waves and nonlinear deformation of the surface in response to bias applied to the tip-surface junction is numerically explored. The 2D maps of the strain and concentration distributions across the mixed ionic-electronic conductor and bias-induced surface displacements are calculated. Furthermore, the obtained numerical results can be applied to quantify the ESM response of Li-based solid electrolytes, materials with resistive switching, and electroactive ferroelectric polymers, which are of potential interest for flexible and high-density non-volatile memory devices.},

  doi          = {10.1063/1.4927815},

  journal      = {Journal of Applied Physics},

  number       = 7,

  volume       = 118,

  place        = {United States},

  year         = {Wed Aug 19 00:00:00 EDT 2015},

  month        = {Wed Aug 19 00:00:00 EDT 2015}

}

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Works referencing / citing this record:

Determination of ferroelectric contributions to electromechanical response by frequency dependent piezoresponse force microscopy
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Title: Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes

Abstract

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Measuring oxygen reduction/evolution reactions on the nanoscale
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