Preface to Special Topic: Piezoresponse Force Microscopy
Abstract
Almost two decades beyond the inception of piezoresponse force microscopy (PFM) and the seminal papers by G€uthner and Dransfeld1 and Gruverman et al., the technique has become the prevailing approach for nanoscale functional characterization of polar materials and has been extended to the probing of other electromechanical effects through the advent of electrochemical strain microscopy (ESM). This focus issue celebrates some of the recent advances in the field and offers a wider outlook of polar materials and their overall characterization. In this paper, we cover topics that include discussions of the properties of traditional ferroelectrics, such as lead zirconate titanate (PZT) and lithium niobate, relaxorferroelectrics, as well as more “exotic” ferroelectric oxides such as hafnia, ferroelectric biological matter, and multiferroic materials. Technique-oriented contributions include papers on the coupling of PFM with other characterization methods such as x-ray diffraction (XRD) and superconducting quantum interface device (SQUID), in addition to considerations on the open questions on the electromechanical response in biased scanning probe microscopy (SPM) techniques, including the effects of the laser spot placement on the readout cantilever displacement, the influence of the tip on the creation of the domain shapes, and the impact of ionic and electronic dynamics on the observedmore »
- Authors:
-
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
- Georgia Inst. of Technology, Atlanta, GA (United States)
- Univ. of Geneva (Switzerland)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC); National Science Foundation (NSF)
- OSTI Identifier:
- 1311252
- Alternate Identifier(s):
- OSTI ID: 1229625
- Grant/Contract Number:
- AC05-00OR22725; DMR-1255379
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 118; Journal Issue: 7; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Balke, Nina, Bassiri-Gharb, Nazanin, and Lichtensteiger, Céline. Preface to Special Topic: Piezoresponse Force Microscopy. United States: N. p., 2015.
Web. doi:10.1063/1.4927818.
Balke, Nina, Bassiri-Gharb, Nazanin, & Lichtensteiger, Céline. Preface to Special Topic: Piezoresponse Force Microscopy. United States. https://doi.org/10.1063/1.4927818
Balke, Nina, Bassiri-Gharb, Nazanin, and Lichtensteiger, Céline. Wed .
"Preface to Special Topic: Piezoresponse Force Microscopy". United States. https://doi.org/10.1063/1.4927818. https://www.osti.gov/servlets/purl/1311252.
@article{osti_1311252,
title = {Preface to Special Topic: Piezoresponse Force Microscopy},
author = {Balke, Nina and Bassiri-Gharb, Nazanin and Lichtensteiger, Céline},
abstractNote = {Almost two decades beyond the inception of piezoresponse force microscopy (PFM) and the seminal papers by G€uthner and Dransfeld1 and Gruverman et al., the technique has become the prevailing approach for nanoscale functional characterization of polar materials and has been extended to the probing of other electromechanical effects through the advent of electrochemical strain microscopy (ESM). This focus issue celebrates some of the recent advances in the field and offers a wider outlook of polar materials and their overall characterization. In this paper, we cover topics that include discussions of the properties of traditional ferroelectrics, such as lead zirconate titanate (PZT) and lithium niobate, relaxorferroelectrics, as well as more “exotic” ferroelectric oxides such as hafnia, ferroelectric biological matter, and multiferroic materials. Technique-oriented contributions include papers on the coupling of PFM with other characterization methods such as x-ray diffraction (XRD) and superconducting quantum interface device (SQUID), in addition to considerations on the open questions on the electromechanical response in biased scanning probe microscopy (SPM) techniques, including the effects of the laser spot placement on the readout cantilever displacement, the influence of the tip on the creation of the domain shapes, and the impact of ionic and electronic dynamics on the observed nanoscale hysteretic phenomena.},
doi = {10.1063/1.4927818},
journal = {Journal of Applied Physics},
number = 7,
volume = 118,
place = {United States},
year = {Wed Aug 19 00:00:00 EDT 2015},
month = {Wed Aug 19 00:00:00 EDT 2015}
}
Web of Science
Works referenced in this record:
Local poling of ferroelectric polymers by scanning force microscopy
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Works referencing / citing this record:
Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale
journal, June 2017
- Vasudevan, Rama K.; Balke, Nina; Maksymovych, Peter
- Applied Physics Reviews, Vol. 4, Issue 2
Ferroelectric or non-ferroelectric: why so many materials exhibit ferroelectricity on the nanoscale
preprint, January 2017
- Vasudevan, Rama K.; Balke, Nina; Maksymovych, Peter
- arXiv