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Title: Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Abstract

In this paper, we demonstrate a method to achieve high efficiency phase contrast imaging in aberration corrected scanning transmission electron microscopy (STEM) with a pixelated detector. The pixelated detector is used to record the Ronchigram as a function of probe position which is then analyzed with ptychography. Ptychography has previously been used to provide super-resolution beyond the diffraction limit of the optics, alongside numerically correcting for spherical aberration. Here we rely on a hardware aberration corrector to eliminate aberrations, but use the pixelated detector data set to utilize the largest possible volume of Fourier space to create high efficiency phase contrast images. The use of ptychography to diagnose the effects of chromatic aberration is also demonstrated. In conclusion, the four dimensional dataset is used to compare different bright field detector configurations from the same scan for a sample of bilayer graphene. Our method of high efficiency ptychography produces the clearest images, while annular bright field produces almost no contrast for an in-focus aberration-corrected probe.

Authors:
ORCiD logo [1];  [2];  [3];  [4];  [3];  [1]
  1. Daresbury Lab. (United Kingdom). EPSRC SuperSTEM Facility; Univ. of Oxford (United Kingdom). Dept. of Materials
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science and Technology Division
  3. Univ. of Oxford (United Kingdom). Dept. of Materials
  4. Nion Co., Kirkland, WA (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Daresbury Lab. (United Kingdom)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); Engineering and Physical Sciences Research Council (EPSRC); European Union (EU)
Contributing Org.:
Univ. of Oxford (United Kingdom)
OSTI Identifier:
1265595
Alternate Identifier(s):
OSTI ID: 1247889
Grant/Contract Number:  
AC05-00OR22725; EP/K032518/1; 312483–ESTEEM2
Resource Type:
Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 151; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 47 OTHER INSTRUMENTATION; STEM; Pixelated detectors; Ptycography; Phase contrast; Chromatic aberrations; DPC; ABF

Citation Formats

Pennycook, Timothy J., Lupini, Andrew R., Yang, Hao, Murfitt, Matthew F., Jones, Lewys, and Nellist, Peter D. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution. United States: N. p., 2014. Web. doi:10.1016/j.ultramic.2014.09.013.
Pennycook, Timothy J., Lupini, Andrew R., Yang, Hao, Murfitt, Matthew F., Jones, Lewys, & Nellist, Peter D. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution. United States. doi:10.1016/j.ultramic.2014.09.013.
Pennycook, Timothy J., Lupini, Andrew R., Yang, Hao, Murfitt, Matthew F., Jones, Lewys, and Nellist, Peter D. Wed . "Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution". United States. doi:10.1016/j.ultramic.2014.09.013. https://www.osti.gov/servlets/purl/1265595.
@article{osti_1265595,
title = {Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution},
author = {Pennycook, Timothy J. and Lupini, Andrew R. and Yang, Hao and Murfitt, Matthew F. and Jones, Lewys and Nellist, Peter D.},
abstractNote = {In this paper, we demonstrate a method to achieve high efficiency phase contrast imaging in aberration corrected scanning transmission electron microscopy (STEM) with a pixelated detector. The pixelated detector is used to record the Ronchigram as a function of probe position which is then analyzed with ptychography. Ptychography has previously been used to provide super-resolution beyond the diffraction limit of the optics, alongside numerically correcting for spherical aberration. Here we rely on a hardware aberration corrector to eliminate aberrations, but use the pixelated detector data set to utilize the largest possible volume of Fourier space to create high efficiency phase contrast images. The use of ptychography to diagnose the effects of chromatic aberration is also demonstrated. In conclusion, the four dimensional dataset is used to compare different bright field detector configurations from the same scan for a sample of bilayer graphene. Our method of high efficiency ptychography produces the clearest images, while annular bright field produces almost no contrast for an in-focus aberration-corrected probe.},
doi = {10.1016/j.ultramic.2014.09.013},
journal = {Ultramicroscopy},
number = ,
volume = 151,
place = {United States},
year = {2014},
month = {10}
}

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Cited by: 35 works
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Works referencing / citing this record:

Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset
journal, July 2017


Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018


Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography
journal, May 2016

  • Jesse, S.; Chi, M.; Belianinov, A.
  • Scientific Reports, Vol. 6, Issue 1
  • DOI: 10.1038/srep26348

4D STEM: High efficiency phase contrast imaging using a fast pixelated detector
journal, October 2015


Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset
journal, July 2017


Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018


Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography
journal, May 2016

  • Jesse, S.; Chi, M.; Belianinov, A.
  • Scientific Reports, Vol. 6, Issue 1
  • DOI: 10.1038/srep26348

4D STEM: High efficiency phase contrast imaging using a fast pixelated detector
journal, October 2015