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Title: Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1352460
Alternate Identifier(s):
OSTI ID: 1417608
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Published Article
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Name: Ultramicroscopy Journal Volume: 180 Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English
Subject:
36 MATERIALS SCIENCE; 4D-STEM; pixelated detectors; ptychography; phase retrieval; Wigner distribution deconvolution

Citation Formats

Yang, Hao, MacLaren, Ian, Jones, Lewys, Martinez, Gerardo T., Simson, Martin, Huth, Martin, Ryll, Henning, Soltau, Heike, Sagawa, Ryusuke, Kondo, Yukihito, Ophus, Colin, Ercius, Peter, Jin, Lei, Kovács, András, and Nellist, Peter D. Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. Netherlands: N. p., 2017. Web. doi:10.1016/j.ultramic.2017.02.006.
Yang, Hao, MacLaren, Ian, Jones, Lewys, Martinez, Gerardo T., Simson, Martin, Huth, Martin, Ryll, Henning, Soltau, Heike, Sagawa, Ryusuke, Kondo, Yukihito, Ophus, Colin, Ercius, Peter, Jin, Lei, Kovács, András, & Nellist, Peter D. Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. Netherlands. doi:10.1016/j.ultramic.2017.02.006.
Yang, Hao, MacLaren, Ian, Jones, Lewys, Martinez, Gerardo T., Simson, Martin, Huth, Martin, Ryll, Henning, Soltau, Heike, Sagawa, Ryusuke, Kondo, Yukihito, Ophus, Colin, Ercius, Peter, Jin, Lei, Kovács, András, and Nellist, Peter D. Fri . "Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution". Netherlands. doi:10.1016/j.ultramic.2017.02.006.
@article{osti_1352460,
title = {Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution},
author = {Yang, Hao and MacLaren, Ian and Jones, Lewys and Martinez, Gerardo T. and Simson, Martin and Huth, Martin and Ryll, Henning and Soltau, Heike and Sagawa, Ryusuke and Kondo, Yukihito and Ophus, Colin and Ercius, Peter and Jin, Lei and Kovács, András and Nellist, Peter D.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.02.006},
journal = {Ultramicroscopy},
number = C,
volume = 180,
place = {Netherlands},
year = {2017},
month = {9}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.ultramic.2017.02.006

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Cited by: 1 work
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Works referencing / citing this record:

Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018


Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018


Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution
journal, February 2018