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Title: Plasticity evolution in nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron X-ray microdiffraction

Authors:
; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1250166
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Additional Journal Information:
Journal Name: Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing Journal Volume: 635 Journal Issue: C; Journal ID: ISSN 0921-5093
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Budiman, A. S., Narayanan, Karthic R., Li, N., Wang, J., Tamura, N., Kunz, M., and Misra, A. Plasticity evolution in nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron X-ray microdiffraction. Netherlands: N. p., 2015. Web. doi:10.1016/j.msea.2015.03.067.
Budiman, A. S., Narayanan, Karthic R., Li, N., Wang, J., Tamura, N., Kunz, M., & Misra, A. Plasticity evolution in nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron X-ray microdiffraction. Netherlands. https://doi.org/10.1016/j.msea.2015.03.067
Budiman, A. S., Narayanan, Karthic R., Li, N., Wang, J., Tamura, N., Kunz, M., and Misra, A. Fri . "Plasticity evolution in nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron X-ray microdiffraction". Netherlands. https://doi.org/10.1016/j.msea.2015.03.067.
@article{osti_1250166,
title = {Plasticity evolution in nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron X-ray microdiffraction},
author = {Budiman, A. S. and Narayanan, Karthic R. and Li, N. and Wang, J. and Tamura, N. and Kunz, M. and Misra, A.},
abstractNote = {},
doi = {10.1016/j.msea.2015.03.067},
journal = {Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing},
number = C,
volume = 635,
place = {Netherlands},
year = {Fri May 01 00:00:00 EDT 2015},
month = {Fri May 01 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.msea.2015.03.067

Citation Metrics:
Cited by: 46 works
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Works referenced in this record:

A superbend X-ray microdiffraction beamline at the advanced light source
journal, October 2009


Slip transmission across fcc/bcc interfaces with varying interface shear strengths
journal, February 2012


Plastic deformation in Al (Cu) interconnects stressed by electromigration and studied by synchrotron polychromatic x-ray microdiffraction
journal, July 2008

  • Chen, Kai; Tamura, N.; Valek, B. C.
  • Journal of Applied Physics, Vol. 104, Issue 1
  • DOI: 10.1063/1.2952073

Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment
journal, December 2008

  • Budiman, A. S.; Besser, P. R.; Hau-Riege, C. S.
  • Journal of Electronic Materials, Vol. 38, Issue 3
  • DOI: 10.1007/s11664-008-0602-5

Transmission electron microscopy investigation of the atomic structure of interfaces in nanoscale Cu–Nb multilayers
journal, June 2008


Atomistic modeling of the interaction of glide dislocations with “weak” interfaces
journal, November 2008


Ex situ and in situ measurements of the shear strength of interfaces in metallic multilayers
journal, September 2012


Study of strain softening behavior of Al–Al3Sc multilayers using microcompression testing
journal, September 2009


In situ x-ray investigation of freestanding nanoscale Cu–Nb multilayers under tensile load
journal, January 2009

  • Aydıner, C. C.; Brown, D. W.; Mara, N. A.
  • Applied Physics Letters, Vol. 94, Issue 3
  • DOI: 10.1063/1.3074374

Analysis of plastic deformation in nanoscale metallic multilayers with coherent and incoherent interfaces
journal, October 2011

  • Zbib, Hussein M.; Overman, Cory T.; Akasheh, Firas
  • International Journal of Plasticity, Vol. 27, Issue 10
  • DOI: 10.1016/j.ijplas.2011.03.006

Plasticity of nanostructured Cu–Nb-based wires: Strengthening mechanisms revealed by in situ deformation under neutrons
journal, February 2009


Submicron x-ray diffraction and its applications to problems in materials and environmental science
journal, March 2002

  • Tamura, N.; Celestre, R. S.; MacDowell, A. A.
  • Review of Scientific Instruments, Vol. 73, Issue 3
  • DOI: 10.1063/1.1436539

A new criterion for elasto-plastic transition in nanomaterials: Application to size and composite effects on Cu–Nb nanocomposite wires
journal, June 2009


Growth and structural characterization of epitaxial Cu/Nb multilayers
journal, April 2011


Plasticity in the nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron Laue x-ray microdiffraction
journal, January 2012

  • Budiman, Arief Suriadi; Han, Seung-Min; Li, Nan
  • Journal of Materials Research, Vol. 27, Issue 3
  • DOI: 10.1557/jmr.2011.421

The multiscale modeling of plastic deformation in metallic nanolayered composites
journal, April 2008


Direct Observations of Confined Layer Slip in Cu/Nb Multilayers
journal, October 2012


Interface Structure and Radiation Damage Resistance in Cu-Nb Multilayer Nanocomposites
journal, April 2008


Following peak profiles during elastic and plastic deformation: A synchrotron-based technique
journal, January 2006

  • Van Swygenhoven, H.; Schmitt, B.; Derlet, P. M.
  • Review of Scientific Instruments, Vol. 77, Issue 1
  • DOI: 10.1063/1.2162453

Design of Radiation Tolerant Nanostructured Metallic Multilayers
journal, August 2012

  • Zhang, X.; Fu, E. G.; Li, Nan
  • Journal of Engineering Materials and Technology, Vol. 134, Issue 4
  • DOI: 10.1115/1.4006979

Length-scale-dependent deformation mechanisms in incoherent metallic multilayered composites
journal, October 2005


Strain rate sensitivity and activation volume of Cu/Ni metallic multilayer thin films measured via micropillar compression
journal, July 2012

  • Carpenter, J. S.; Misra, A.; Uchic, M. D.
  • Applied Physics Letters, Vol. 101, Issue 5
  • DOI: 10.1063/1.4739521

Indentation size effects in single crystal copper as revealed by synchrotron x-ray microdiffraction
journal, August 2008

  • Feng, G.; Budiman, A. S.; Nix, W. D.
  • Journal of Applied Physics, Vol. 104, Issue 4
  • DOI: 10.1063/1.2966297

Time-Resolved Laue Diffraction of Deforming Micropillars
journal, October 2007


Radiation damage tolerant nanomaterials
journal, November 2013


Structure of Kurdjumov–Sachs interfaces in simulations of a copper–niobium bilayer
journal, January 2008


Dislocation mechanisms and symmetric slip in rolled nano-scale metallic multilayers
journal, May 2004


An overview of interface-dominated deformation mechanisms in metallic multilayers
journal, February 2011


Design of Radiation Tolerant Materials Via Interface Engineering
journal, September 2013

  • Han, Weizhong; Demkowicz, Michael J.; Mara, Nathan A.
  • Advanced Materials, Vol. 25, Issue 48
  • DOI: 10.1002/adma.201303400

High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam
journal, June 2005

  • Tamura, N.; Padmore, H. A.; Patel, J. R.
  • Materials Science and Engineering: A, Vol. 399, Issue 1-2
  • DOI: 10.1016/j.msea.2005.02.033

Mechanics of nanoscale metallic multilayers: From atomic-scale to micro-scale
journal, June 2009


Atomistic simulations of the shear strength and sliding mechanisms of copper–niobium interfaces
journal, August 2008


Rolling textures in nanoscale Cu/Nb multilayers
journal, December 2003


Dislocation storage in single slip-oriented Cu micro-tensile samples: new insights via X-ray microdiffraction
journal, March 2011


Interface dislocation patterns and dislocation nucleation in face-centered-cubic and body-centered-cubic bicrystal interfaces
journal, February 2014


Electromigration-Induced Plastic Deformation in Cu Interconnects: Effects on Current Density Exponent, n, and Implications for EM Reliability Assessment
journal, September 2010

  • Budiman, A. S.; Hau-Riege, C. S.; Baek, W. C.
  • Journal of Electronic Materials, Vol. 39, Issue 11
  • DOI: 10.1007/s11664-010-1356-4

The influence of interface shear strength on the glide dislocation–interface interactions
journal, May 2011


Microstructure Evolution and Defect Formation in Cu Through-Silicon Vias (TSVs) During Thermal Annealing
journal, February 2012

  • Shin, Hae-A-Seul; Kim, Byoung-Joon; Kim, Ju-Heon
  • Journal of Electronic Materials, Vol. 41, Issue 4
  • DOI: 10.1007/s11664-012-1943-7

Defect structure in micropillars using x-ray microdiffraction
journal, October 2006

  • Maaβ, R.; Grolimund, D.; Van Petegem, S.
  • Applied Physics Letters, Vol. 89, Issue 15
  • DOI: 10.1063/1.2358204

Plasticity mechanism for copper extrusion in through-silicon vias for three-dimensional interconnects
journal, November 2013

  • Jiang, Tengfei; Wu, Chenglin; Spinella, Laura
  • Applied Physics Letters, Vol. 103, Issue 21
  • DOI: 10.1063/1.4833020

On the role of weak interfaces in blocking slip in nanoscale layered composites
journal, August 2006


Compressive flow behavior of Al–TiN multilayers at nanometer scale layer thickness
journal, June 2011


Measurement of stresses in Cu and Si around through-silicon via by synchrotron X-ray microdiffraction for 3-dimensional integrated circuits
journal, March 2012


Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films
journal, February 2003

  • Tamura, N.; MacDowell, A. A.; Spolenak, R.
  • Journal of Synchrotron Radiation, Vol. 10, Issue 2
  • DOI: 10.1107/S0909049502021362

Crystal plasticity in Cu damascene interconnect lines undergoing electromigration as revealed by synchrotron x-ray microdiffraction
journal, June 2006

  • Budiman, A. S.; Nix, W. D.; Tamura, N.
  • Applied Physics Letters, Vol. 88, Issue 23
  • DOI: 10.1063/1.2210451

Metal plasticity by grain rotation—Microdiffraction case studies
journal, October 2009

  • Magid, K. R.; Nyilas, R. D.; Spolenak, R.
  • Materials Science and Engineering: A, Vol. 524, Issue 1-2
  • DOI: 10.1016/j.msea.2009.05.004

Micro-strains in cold rolled Cu–Nb nanolayered composites determined by X-ray line profile analysis
journal, February 2006


Effect of Interfaces in the Work Hardening of Nanoscale Multilayer Metallic Composites During Nanoindentation: A Molecular Dynamics Investigation
journal, March 2013

  • Shao, S.; Zbib, H. M.; Mastorakos, I.
  • Journal of Engineering Materials and Technology, Vol. 135, Issue 2
  • DOI: 10.1115/1.4023672

Multiscale modeling and simulation of deformation in nanoscale metallic multilayer systems
journal, January 2014


Attempt to Design a Strong Solid
journal, July 1970