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Title: Preferential emission into epsilon-near-zero metamaterial [Invited]

Abstract

We report the use of epsilon near zero (ENZ) metamaterial to control spontaneous emission from Zinc-Oxide (ZnO) excitons. The ENZ material consists of alternating layers of silver and alumina with subwavelength thicknesses, resulting in an effective medium where one of the components of the dielectric constant approach zero between 370nm-440nm wavelength range. Bulk ZnO with photoluminescence maximum in the ENZ regime was deposited via atomic layer deposition to obtain a smooth film with near field coupling to the ENZ metamaterial. Preferential emission from the ZnO layer into the metamaterial with suppression of forward emission by 90% in comparison to ZnO on silicon is observed. We attribute this observation to the presence of dispersionless plasmonic modes in the ENZ regime as shown by the results of theoretical modeling presented here. Integration of ENZ metamaterials with light emitters is an attractive platform for realizing a low threshold subwavelength laser.

Authors:
 [1];  [1];  [2];  [1]
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  1. City College of New York, NY (United States); City Univ. (CUNY), NY (United States)
  2. Univ. of Alberta, Edmonton, AB (Canada)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1240644
Grant/Contract Number:  
AC02-98CH10886
Resource Type:
Accepted Manuscript
Journal Name:
Optical Materials Express
Additional Journal Information:
Journal Volume: 5; Journal Issue: 12; Journal ID: ISSN 2159-3930
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; 54 ENVIRONMENTAL SCIENCES

Citation Formats

Galfsky, Tal, Sun, Zheng, Jacob, Zubin, and Menon, Vinod M. Preferential emission into epsilon-near-zero metamaterial [Invited]. United States: N. p., 2015. Web. doi:10.1364/OME.5.002878.
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Galfsky, Tal, Sun, Zheng, Jacob, Zubin, & Menon, Vinod M. Preferential emission into epsilon-near-zero metamaterial [Invited]. United States. https://doi.org/10.1364/OME.5.002878
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Galfsky, Tal, Sun, Zheng, Jacob, Zubin, and Menon, Vinod M. Mon . "Preferential emission into epsilon-near-zero metamaterial [Invited]". United States. https://doi.org/10.1364/OME.5.002878. https://www.osti.gov/servlets/purl/1240644.
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@article{osti_1240644,
title = {Preferential emission into epsilon-near-zero metamaterial [Invited]},
author = {Galfsky, Tal and Sun, Zheng and Jacob, Zubin and Menon, Vinod M.},
abstractNote = {We report the use of epsilon near zero (ENZ) metamaterial to control spontaneous emission from Zinc-Oxide (ZnO) excitons. The ENZ material consists of alternating layers of silver and alumina with subwavelength thicknesses, resulting in an effective medium where one of the components of the dielectric constant approach zero between 370nm-440nm wavelength range. Bulk ZnO with photoluminescence maximum in the ENZ regime was deposited via atomic layer deposition to obtain a smooth film with near field coupling to the ENZ metamaterial. Preferential emission from the ZnO layer into the metamaterial with suppression of forward emission by 90% in comparison to ZnO on silicon is observed. We attribute this observation to the presence of dispersionless plasmonic modes in the ENZ regime as shown by the results of theoretical modeling presented here. Integration of ENZ metamaterials with light emitters is an attractive platform for realizing a low threshold subwavelength laser.},
doi = {10.1364/OME.5.002878},
journal = {Optical Materials Express},
number = 12,
volume = 5,
place = {United States},
year = {Mon Nov 23 00:00:00 EST 2015},
month = {Mon Nov 23 00:00:00 EST 2015}
}
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Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1364/OME.5.002878
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Cited by: 3 works
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Figures / Tables:

Fig. 1 Fig. 1: (a) Cross section of 4P structure imaged by transmission electron microscope (TEM). Ag shows as dark stripes, Al2O3 as bright, bottom most layer is Si substrate, topmost layer is a protective Pt layer which is deposited as a part of the cross-sectioning process. (b) Effective permittivity components ofmore » the metamaterial. Calculated using optical constants on thin layer Ag and Al2O3 obtained from ellipsometry (see Data File 1 and Data File 2). Region I: Type I hyperbolic dispersion, Region II: Elliptical dispersion, Region III: ENZ regime, Region IV: Type II hyperbolic dispersion. Dashed line marks the emission peak of ZnO.« less
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Works referenced in this record:

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    Works referencing / citing this record:

    Strong Nonlinear Optical Response in the Visible Spectral Range with Epsilon‐Near‐Zero Organic Thin Films
    journal, May 2018

    • Lee, Yeon Ui; Garoni, Eleonora; Kita, Hanayo
    • Advanced Optical Materials, Vol. 6, Issue 14
    • DOI: 10.1002/adom.201701400
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