Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE Advanced Research Projects Agency - Energy (ARPA-E)
- OSTI Identifier:
- 1238954
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Journal of Physics. D, Applied Physics
- Additional Journal Information:
- Journal Name: Journal of Physics. D, Applied Physics Journal Volume: 48 Journal Issue: 19; Journal ID: ISSN 0022-3727
- Publisher:
- IOP Publishing
- Country of Publication:
- United Kingdom
- Language:
- English
Citation Formats
Patino, M. I., Raitses, Y., Koel, B. E., and Wirz, R. E. Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics. United Kingdom: N. p., 2015.
Web. doi:10.1088/0022-3727/48/19/195204.
Patino, M. I., Raitses, Y., Koel, B. E., & Wirz, R. E. Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics. United Kingdom. https://doi.org/10.1088/0022-3727/48/19/195204
Patino, M. I., Raitses, Y., Koel, B. E., and Wirz, R. E. Wed .
"Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics". United Kingdom. https://doi.org/10.1088/0022-3727/48/19/195204.
@article{osti_1238954,
title = {Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics},
author = {Patino, M. I. and Raitses, Y. and Koel, B. E. and Wirz, R. E.},
abstractNote = {},
doi = {10.1088/0022-3727/48/19/195204},
journal = {Journal of Physics. D, Applied Physics},
number = 19,
volume = 48,
place = {United Kingdom},
year = {Wed Apr 08 00:00:00 EDT 2015},
month = {Wed Apr 08 00:00:00 EDT 2015}
}
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https://doi.org/10.1088/0022-3727/48/19/195204
https://doi.org/10.1088/0022-3727/48/19/195204
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Cited by: 22 works
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