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Title: Measuring circuit

Abstract

An automatic gain control circuit functions to adjust the magnitude of an input signal supplied to a measuring circuit to a level within the dynamic range of the measuring circuit while a log-ratio circuit adjusts the magnitude of the output signal from the measuring circuit to the level of the input signal and optimizes the signal-to-noise ratio performance of the measuring circuit.

Inventors:
 [1];  [2]
  1. Pittsburgh, PA
  2. Cockeysville, MD
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
OSTI Identifier:
862746
Patent Number(s):
4002977
Assignee:
Westinghouse Electric Corporation (Pittsburgh, PA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
H - ELECTRICITY H03 - BASIC ELECTRONIC CIRCUITRY H03G - CONTROL OF AMPLIFICATION
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
measuring; circuit; automatic; control; functions; adjust; magnitude; input; signal; supplied; level; dynamic; range; log-ratio; adjusts; output; optimizes; signal-to-noise; ratio; performance; signal-to-noise ratio; dynamic range; control circuit; output signal; input signal; noise ratio; measuring circuit; circuit functions; signal supplied; /324/327/

Citation Formats

Sun, Shan C, and Chaprnka, Anthony G. Measuring circuit. United States: N. p., 1977. Web.
Sun, Shan C, & Chaprnka, Anthony G. Measuring circuit. United States.
Sun, Shan C, and Chaprnka, Anthony G. Tue . "Measuring circuit". United States. https://www.osti.gov/servlets/purl/862746.
@article{osti_862746,
title = {Measuring circuit},
author = {Sun, Shan C and Chaprnka, Anthony G},
abstractNote = {An automatic gain control circuit functions to adjust the magnitude of an input signal supplied to a measuring circuit to a level within the dynamic range of the measuring circuit while a log-ratio circuit adjusts the magnitude of the output signal from the measuring circuit to the level of the input signal and optimizes the signal-to-noise ratio performance of the measuring circuit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 11 00:00:00 EST 1977},
month = {Tue Jan 11 00:00:00 EST 1977}
}