Nondestructive method for detecting defects in photodetector and solar cell devices
Abstract
The invention described herein is a method for locating semiconductor device defects and for measuring the internal resistance of such devices by making use of the intrinsic distributed resistance nature of the devices. The method provides for forward-biasing a solar cell or other device while it is scanning with an optical spot. The forward-biasing is achieved with either an illuminator light source or an external current source.
- OSTI Identifier:
- 5430562
- Assignee:
- TIC; ERA-05-020273; EDB-80-054992
- DOE Contract Number:
- EA-77-A-01-6010
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; SOLAR CELLS; DEFECTS; ELECTRIC CONDUCTIVITY; INSPECTION; CRACKS; CRYSTAL DEFECTS; ELECTRIC CONTACTS; MEASURING INSTRUMENTS; MEASURING METHODS; OPTICAL SCANNERS; PHOTODETECTORS; CRYSTAL STRUCTURE; DIRECT ENERGY CONVERTERS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; OPTICAL EQUIPMENT; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; PHYSICAL PROPERTIES; SOLAR EQUIPMENT; 140501* - Solar Energy Conversion- Photovoltaic Conversion
Citation Formats
. Nondestructive method for detecting defects in photodetector and solar cell devices. United States: N. p.,
Web.
. Nondestructive method for detecting defects in photodetector and solar cell devices. United States.
. .
"Nondestructive method for detecting defects in photodetector and solar cell devices". United States.
@article{osti_5430562,
title = {Nondestructive method for detecting defects in photodetector and solar cell devices},
author = {},
abstractNote = {The invention described herein is a method for locating semiconductor device defects and for measuring the internal resistance of such devices by making use of the intrinsic distributed resistance nature of the devices. The method provides for forward-biasing a solar cell or other device while it is scanning with an optical spot. The forward-biasing is achieved with either an illuminator light source or an external current source.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {},
month = {}
}
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