Nondestructive method for detecting defects in photodetector and solar cell devices
Abstract
The invention described herein is a method for locating semiconductor device defects and for measuring the internal resistance of such devices by making use of the intrinsic distributed resistance nature of the devices. The method provides for forward-biasing a solar cell or other device while it is scanning with an optical spot. The forward-biasing is achieved with either an illuminator light source or an external current source.
- Inventors:
-
- Rockville, MD
- Issue Date:
- OSTI Identifier:
- 863976
- Patent Number(s):
- 4287473
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- DOE Contract Number:
- EA77A016010
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- nondestructive; method; detecting; defects; photodetector; solar; cell; devices; described; locating; semiconductor; device; measuring; internal; resistance; intrinsic; distributed; nature; provides; forward-biasing; scanning; optical; spot; achieved; illuminator; light; source; external; current; cell device; nondestructive method; light source; solar cell; semiconductor device; current source; method provides; method provide; cell devices; detecting defects; external current; /324/136/
Citation Formats
Sawyer, David E. Nondestructive method for detecting defects in photodetector and solar cell devices. United States: N. p., 1981.
Web.
Sawyer, David E. Nondestructive method for detecting defects in photodetector and solar cell devices. United States.
Sawyer, David E. Thu .
"Nondestructive method for detecting defects in photodetector and solar cell devices". United States. https://www.osti.gov/servlets/purl/863976.
@article{osti_863976,
title = {Nondestructive method for detecting defects in photodetector and solar cell devices},
author = {Sawyer, David E},
abstractNote = {The invention described herein is a method for locating semiconductor device defects and for measuring the internal resistance of such devices by making use of the intrinsic distributed resistance nature of the devices. The method provides for forward-biasing a solar cell or other device while it is scanning with an optical spot. The forward-biasing is achieved with either an illuminator light source or an external current source.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 1981},
month = {Thu Jan 01 00:00:00 EST 1981}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.