Super resolution for magneto-optical microscopy
Abstract
Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1986714
- Patent Number(s):
- 11474283
- Application Number:
- 16/916,895
- Assignee:
- UChicago Argonne, LLC (Chicago, IL)
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 06/30/2020
- Country of Publication:
- United States
- Language:
- English
Citation Formats
te Velthuis, Suzanne Gabriëlle Everdine, Vogel, Michael Claus Siegfried, and Hoffmann, Axel Friedrich. Super resolution for magneto-optical microscopy. United States: N. p., 2022.
Web.
te Velthuis, Suzanne Gabriëlle Everdine, Vogel, Michael Claus Siegfried, & Hoffmann, Axel Friedrich. Super resolution for magneto-optical microscopy. United States.
te Velthuis, Suzanne Gabriëlle Everdine, Vogel, Michael Claus Siegfried, and Hoffmann, Axel Friedrich. Tue .
"Super resolution for magneto-optical microscopy". United States. https://www.osti.gov/servlets/purl/1986714.
@article{osti_1986714,
title = {Super resolution for magneto-optical microscopy},
author = {te Velthuis, Suzanne Gabriëlle Everdine and Vogel, Michael Claus Siegfried and Hoffmann, Axel Friedrich},
abstractNote = {Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Oct 18 00:00:00 EDT 2022},
month = {Tue Oct 18 00:00:00 EDT 2022}
}
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