Title: Super resolution for magneto-optical microscopy

Abstract

Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.

Inventors:

te Velthuis, Suzanne Gabriëlle Everdine; Vogel, Michael Claus Siegfried; Hoffmann, Axel Friedrich

Issue Date:

2022-10-18

Research Org.:

Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1986714

Patent Number(s):

11474283

Application Number:

16/916,895

Assignee:

UChicago Argonne, LLC (Chicago, IL)

Patent Classifications (CPCs):

B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES

B82Y20/00 - Nanooptics, e.g. quantum optics or photonic crystals

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N2021/218 - {Measuring properties of electrooptical or magnetooptical media}
G01N2021/8848 - {Polarisation of light}
G01N21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
G01N21/21 - Polarisation-affecting properties

G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES

G01R33/032 - using magneto-optic devices, e.g. Faraday {, Cotton-Mouton effect
G01R33/0322 - {using the Faraday or Voigt effect}
G01R33/0325 - {using the Kerr effect}
G01R33/1292 - {Measuring domain wall position or domain wall motion}

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

G02B21/0016 - {Technical microscopes, e.g. for inspection or measuring in industrial production processes}
G02B21/06 - Means for illuminating specimens
G02B27/56 - Optics using evanescent waves, i.e. inhomogeneous waves
G02B27/58 - Optics for apodization or superresolution
G02B3/0006 - {Arrays
G02B3/0037 - {characterized by the distribution or form of lenses}

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DOE Contract Number:  

AC02-06CH11357

Resource Type:

Patent

Resource Relation:

Patent File Date: 06/30/2020

Country of Publication:

United States

Language:

English