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Title: Enhanced neutron detector and electron amplifier structure and a method of fabricating the enhanced neutron detector and electron amplifier structure

Abstract

An enhanced electron amplifier structure includes a substrate configured to amplify a signal of an incident particle by causing a cascade of secondary electron emissions and an enhancement layer configured to increase a sensitivity of the substrate to the incident particle. The enhancement layer is provided on an upper surface of the substrate.

Inventors:
;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1531402
Patent Number(s):
10,180,508
Application Number:
15/691,652
Assignee:
UChicago Argonne, LLC (Chicago, IL)
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 2017-08-30
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Mane, Anil U., and Elam, Jeffrey W. Enhanced neutron detector and electron amplifier structure and a method of fabricating the enhanced neutron detector and electron amplifier structure. United States: N. p., 2019. Web.
Mane, Anil U., & Elam, Jeffrey W. Enhanced neutron detector and electron amplifier structure and a method of fabricating the enhanced neutron detector and electron amplifier structure. United States.
Mane, Anil U., and Elam, Jeffrey W. Tue . "Enhanced neutron detector and electron amplifier structure and a method of fabricating the enhanced neutron detector and electron amplifier structure". United States. https://www.osti.gov/servlets/purl/1531402.
@article{osti_1531402,
title = {Enhanced neutron detector and electron amplifier structure and a method of fabricating the enhanced neutron detector and electron amplifier structure},
author = {Mane, Anil U. and Elam, Jeffrey W.},
abstractNote = {An enhanced electron amplifier structure includes a substrate configured to amplify a signal of an incident particle by causing a cascade of secondary electron emissions and an enhancement layer configured to increase a sensitivity of the substrate to the incident particle. The enhancement layer is provided on an upper surface of the substrate.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {1}
}

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Works referenced in this record:

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  • Photonics Asia 2004, SPIE Proceedings
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Thermoelectric device with multiple, nanometer scale, elements
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