Single-frame far-field diffractive imaging with randomized illumination

Levitan, Abraham

doi:10.11577/1722945

Title: Single-frame far-field diffractive imaging with randomized illumination

Dataset
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Abstract

Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.

Authors:

Levitan, Abraham

CXIDB

Publication Date:: Mon Nov 23 23:00:00 EST 2020

Other Number(s):: CXIDB ID 176

DOE Contract Number:: AC02-05CH11231

Research Org.:: Coherent X-ray Imaging Data Bank (Lawrence Berkeley National Laboratory); MIT

Sponsoring Org.:: MIT

Subject:: BESSY II; MAXYMUS; Ptychography, Randomized Probe Imaging; Siemens Star, Fe/Gd Multilayer; X-ray Free-electorn Lasers; XFEL

OSTI Identifier:: 1722945

DOI:: https://doi.org/10.11577/1722945

Citation Formats


                    Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination.  United States: N. p., 2020. 
        Web.  doi:10.11577/1722945.

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                    Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination.  United States.  doi:https://doi.org/10.11577/1722945

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                    Levitan, Abraham. 2020.  
"Single-frame far-field diffractive imaging with randomized illumination".  United States.  doi:https://doi.org/10.11577/1722945.  https://www.osti.gov/servlets/purl/1722945. Pub date:Mon Nov 23 23:00:00 EST 2020

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@article{osti_1722945,

  title        = {Single-frame far-field diffractive imaging with randomized illumination},

  author       = {Levitan, Abraham},

  abstractNote = {Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.},

  doi          = {10.11577/1722945},

  journal      = {},

  number       = ,

  volume       = ,

  place        = {United States},

  year         = {Mon Nov 23 23:00:00 EST 2020},

  month        = {Mon Nov 23 23:00:00 EST 2020}

}

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DOI: https://doi.org/10.11577/1722945

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