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Title: Single-frame far-field diffractive imaging with randomized illumination

Abstract

Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.

Authors:
Publication Date:
Other Number(s):
CXIDB ID 176
DOE Contract Number:  
AC02-05CH11231
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Coherent X-ray Imaging Data Bank; Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Org.:
MIT
Keywords:
MAXYMUS; BESSY II; XFEL; X-ray Free-electorn Lasers; Ptychography, Randomized Probe Imaging; Siemens Star, Fe/Gd Multilayer
OSTI Identifier:
1722945
DOI:
https://doi.org/10.11577/1722945

Citation Formats

Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination. United States: N. p., 2020. Web. doi:10.11577/1722945.
Levitan, Abraham. Single-frame far-field diffractive imaging with randomized illumination. United States. doi:https://doi.org/10.11577/1722945
Levitan, Abraham. 2020. "Single-frame far-field diffractive imaging with randomized illumination". United States. doi:https://doi.org/10.11577/1722945. https://www.osti.gov/servlets/purl/1722945. Pub date:Tue Nov 24 00:00:00 EST 2020
@article{osti_1722945,
title = {Single-frame far-field diffractive imaging with randomized illumination},
author = {Levitan, Abraham},
abstractNote = {Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.},
doi = {10.11577/1722945},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {11}
}

Works referenced in this record:

Single-frame far-field diffractive imaging with randomized illumination
journal, January 2020